Real‐time simulation of thin‐film interference with surface thickness variation using the shallow water equations

Abstract

Thin‐film interference is a significant optical phenomenon. In this study, we employed the transfer matrix method to pre‐calculate the reflectance of thin‐films at visible light wavelengths. The reflectance is saved as a texture through color space transformation. This advancement has made real‐time rendering of thin‐film interference feasible. Furthermore, we proposed the implementation of shallow water equations to simulate the morphological evolution of liquid thin‐films. This approach facilitates the interpretation and prediction of behaviors and thickness variations in liquid thin‐films. We also introduced a viscosity term into the shallow water equations to more accurately simulate the behavior of thin‐films, thus facilitating the creation of authentic interference patterns.