2002
DOI: 10.1063/1.1526161
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Realization of wide electron slabs by polarization bulk doping in graded III–V nitride semiconductor alloys

Abstract: We present the concept and experimental realization of polarization-induced bulk electron doping in III-V nitride semiconductors. By exploiting the large polarization charges in the III-V nitrides, we are able to create wide slabs of high density mobile electrons without introducing shallow donors. Transport measurements reveal the superior properties of the polarization doped electron distributions than comparable shallow donor doped structures. The technique is readily employed for creating highly conductive… Show more

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Cited by 175 publications
(138 citation statements)
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“…This technique has in fact been demonstrated for AlGaN graded from 0-30% Al. [333] Another approach is to utilize a superlattice in which the polarization-induced electric fields cause ionization of the impurity dopants due to extreme band-bending. [334] Ohmic Contacts: Ohmic contacts are another significant challenge for UWBG materials.…”
Section: Processingmentioning
confidence: 99%
“…This technique has in fact been demonstrated for AlGaN graded from 0-30% Al. [333] Another approach is to utilize a superlattice in which the polarization-induced electric fields cause ionization of the impurity dopants due to extreme band-bending. [334] Ohmic Contacts: Ohmic contacts are another significant challenge for UWBG materials.…”
Section: Processingmentioning
confidence: 99%
“…To screen the net positive charge at the AlGaN/GaN junction, a 2DEG forms. Jena et al 11 have shown that the same effect can also be used to create a bulk three-dimensional electron slab. This is achieved by grading from GaN to AlGaN, thus spreading the polarization-induced charge over the graded region.…”
mentioning
confidence: 99%
“…As in a HEMT, the performance of the PolFET improves at lower temperatures since phonon scattering is reduced, and the mobility is higher. 11 For comparison, two samples, a conventional impuritydoped MESFET and a polarization-doped FET, or PolFET, were studied ͑Fig. 1͒.…”
mentioning
confidence: 99%
“…3 (b) we observe for samples S1-S4 carrier mobilities which are comparable [36] or slightly lower than those observed in 3DES fabricated by MBE [18,19]. However,the Al concentration in the above mentioned works had a gradient in the range x: 0%→20%, while all the samples considered in this work have a Al gradient x: 0%→37%.…”
Section: Resultsmentioning
confidence: 67%
“…Specifically, a compositional grading in the Al x Ga 1−x N layer results in a non-vanishing divergence of the polarization, leading to the formation of a bulk three-dimensional (3D) polarization charge background, i.e. to a polarization induced 3D electron slab (3DES) [18][19][20]. An analogous approach can also be exploited in a polarization doped hole system, where the grading may be designed to span from an Al rich to an Al depleted alloy [21].…”
Section: Introductionmentioning
confidence: 99%