We discuss an AlGaN/GaN metal-semiconductor field-effect transistor ͑MESFET͒ structure grown without any impurity doping in the channel. A high-mobility polarization-induced bulk channel charge was created by grading the channel region linearly from GaN to Al 0.3 Ga 0.7 N over 1000 Å. This polarization-doped FET ͑PolFET͒ was fabricated and tested under dc and rf conditions. Current density of 850 mA/mm and transconductance of 93 mS/mm was observed under dc conditions. The 0.7 m gate length devices had a cutoff frequency, f ϭ19 GHz, and maximum oscillation frequency, f max ϭ46 GHz. We demonstrate that the PolFETs perform better than comparable MESFETs with impurity-doped channels, and are suitable for high power microwave applications. An important advantage of these devices over AlGaN/GaN high electron mobility transistors is that the transconductance versus gate voltage profile can be tailored by compositional grading for better large-signal linearity.