Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle

Huang, Xianrong; Peng, Ru‐Wen; Gög, T.; Siddons, D. P.; Assoufid, Lahsen

doi:10.1063/1.4901046

Cited by 4 publications

(3 citation statements)

References 18 publications

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“…1(b) under exact eight-beam diffraction will be discussed. To identify the origin of the two peaks, small homogeneous inplane (along the x and y axes) and out-of-plane (along the z axis) strains were artificially induced in the crystal (Huang, Peng et al, 2014). The contour plots of the simulated threedimensional rocking curves of the diffracted beam along the [006] direction with zero and Ád i /d = À0.0002 (i = x, y or z) strains are shown in Figs.…”

Section: Multiple-wave Propagation Channel and Interference Modelmentioning

confidence: 99%

“…On the one hand, the MBD effect is detrimental to crystal-based monochromators because it may affect the output intensity at particular energy positions by significantly reducing the efficiency of the primary diffracted beam (Van der laan & Thole, 1988;Tang et al, 2015). On the other hand, the MBD effect has drawn much attention in recent decades for its many applications, including structure phase determination (Weckert & Hü mmer, 1997;Shen, 1998); X-ray energy calibration (Arthur, 1989); X-ray polarization analyses (Shen & Finkelstein, 1992); and revealing surface structure information via a specific MBD geometry, otherwise known as Bragg surface diffraction (Lang et al, 2013;Huang, Jia et al, 2014;Huang, Peng et al, 2014).…”

Section: Introductionmentioning

confidence: 99%

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A polarization-switch effect of silicon crystals under multiple-beam diffraction geometry

et al. 2021

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On the basis of rigorous dynamical-theory calculations, a complete X-ray polarization-switch effect of silicon crystals at the exact multiple-beam diffraction condition is demonstrated. The underlying physical mechanism of this unique phenomenon can be revealed using a simple multiple-wave propagation and interference model. The constructive and destructive interference of the multiple detoured-diffraction beams along the direction of the primary diffracted beam directly leads to the complete polarization switch. This phenomenon can be realized using both synchrotron and laboratory X-ray sources at many discrete wavelengths, and used to design a novel crystal-based polarizer to achieve a 90° polarization rotation.

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Section: Multiple-wave Propagation Channel and Interference Modelmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A polarization-switch effect of silicon crystals under multiple-beam diffraction geometry

et al. 2021

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“…A special case of the XRMD phenomenon is Bragg surface diffraction (BSD), a three-beam case in which the secondary diffracted beam propagates parallel to the crystal surface under an extremely asymmetric geometry (Jen & Chang, 1992;Chang, 2004;Huang et al, 2014). The BSD reflections, which appear as peaks in an RS, carry information on the crystal surface and even on a material interface (layer/substrate) in an epitaxial structure (Morelhã o et al, 1991;Morelhã o & Cardoso, 1993Sun et al, 2006;de Menezes et al, 2010).…”

Section: X-ray Multiple Diffraction and The Renninger Scanmentioning

confidence: 99%

Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans

et al. 2019

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This paper reports the successful extension of the basis of the X‐ray multiple diffraction phenomenon in the assessment of structural phase transitions and the determination of thermal expansion coefficients along three crystallographic directions, using synchrotron radiation Renninger scans. Suitable simultaneous four‐beam cases have accurately resolved the lattice‐parameter variation in a nearly perfect single‐crystal Rochelle salt using a high‐stability temperature apparatus. Secondary reflections observed in the Renninger patterns, chosen by their sensitivity to the shifts in angular position as a function of temperature, have allowed the detection of a monoclinic to orthorhombic phase transition, as well as subtle expansions of all the basic lattice parameters, i.e. without having to carry out measurements on each crystal axis. The thermal expansion coefficients have been estimated from the linear fit of the temperature dependence of the lattice parameters, and are in agreement with those reported in the literature.

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Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings

Calligaris

Lang

Bettini³

et al. 2016

Applied Physics Letters

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In this paper, the dependence of a Laue diffraction streak on the crystalline perfection of Xe-implanted Si(001) substrates is presented, based on the observation in the X-ray multiple diffraction (XRMD) mappings, as an experimental evidence of the transition between dynamical and kinematical diffraction regimes. A direct observation of the implanted region by transmission electron microscopy revealed an amorphous Si layer, which recrystallizes into a heavily twinned and faulted microstructure after thermal treatment at 800 °C. Besides the lattice damages, the annealing induces the formation of Xe bubbles. Both singularly affect the XRMD pattern, primarily the four-fold streaks profile of the (000)(002)(11¯1¯)(11¯3) four-beam simultaneous case when compared with the pristine Si pattern, highlighting the intra- and inter-block diffractions and the role played by the primary extinction effect. Such features provide information on the dominant diffraction regime. The findings are also discussed and compared to the conventional reciprocal space mappings via the asymmetric Si(113) reflection.

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Realizing in-plane surface diffraction by x-ray multiple-beam diffraction with large incidence angle

Cited by 4 publications

References 18 publications

A polarization-switch effect of silicon crystals under multiple-beam diffraction geometry

A polarization-switch effect of silicon crystals under multiple-beam diffraction geometry

Assessment of phase transition and thermal expansion coefficients by means of secondary multiple reflections of Renninger scans

Experimental evidence of transition between dynamical and kinematical diffraction regimes in ion-implanted Si observed through X-ray multiple-beam diffraction mappings

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