2004
DOI: 10.1109/jstqe.2004.833971
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Recent Advances in Avalanche Photodiodes

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Cited by 169 publications
(68 citation statements)
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“…Impact ionisation process is initiated at high reverse bias in these materials. Evacuation rate of charge carriers from the depletion region is also slow [8][9][10][11][12] . High excess noise factor (F) is reported in Si and III-V based materials due to the involvement of both type of carriers (electrons and holes) in the multiplication process.…”
Section: Iii-v Materials Based Irapdsmentioning
confidence: 99%
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“…Impact ionisation process is initiated at high reverse bias in these materials. Evacuation rate of charge carriers from the depletion region is also slow [8][9][10][11][12] . High excess noise factor (F) is reported in Si and III-V based materials due to the involvement of both type of carriers (electrons and holes) in the multiplication process.…”
Section: Iii-v Materials Based Irapdsmentioning
confidence: 99%
“…High excess noise factor (F) is reported in Si and III-V based materials due to the involvement of both type of carriers (electrons and holes) in the multiplication process. Band width is achieved in the range of 300 GHz -400 GHz in III-V APDs [10][11] . Several groups are involved in the development of the advanced APD detector for detection of ultraviolet (UV) light signals [14][15][16][17][18][19] .…”
Section: Iii-v Materials Based Irapdsmentioning
confidence: 99%
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