2021
DOI: 10.1088/1361-6463/ac1af2
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Recent advances in the growth of gallium oxide thin films employing various growth techniques—a review

Abstract: R. (2021). Recent advances in the growth of gallium oxide thin films employing various growth techniques-A review.

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Cited by 97 publications
(71 citation statements)
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“…The shoulder of ε-Ga2O3 at the diffraction peak along (-402), corresponding to β-Ga2O3 at 2θ = 38.12°, disappeared in the annealed Ga2O3 film at 800 °C, while a diffraction peak along (0002) remained at 2θ = 19.10°, corresponding to ε-Ga2O3. The metastable εphase transformed into the thermodynamically stable β-phase within the range of 700-800 °C [3,12,29,30]. The intensities of the diffraction peaks along (-201), (-402), and (-603) increased with an increase in temperature, as shown in Figure 2a.…”
Section: Resultsmentioning
confidence: 90%
“…The shoulder of ε-Ga2O3 at the diffraction peak along (-402), corresponding to β-Ga2O3 at 2θ = 38.12°, disappeared in the annealed Ga2O3 film at 800 °C, while a diffraction peak along (0002) remained at 2θ = 19.10°, corresponding to ε-Ga2O3. The metastable εphase transformed into the thermodynamically stable β-phase within the range of 700-800 °C [3,12,29,30]. The intensities of the diffraction peaks along (-201), (-402), and (-603) increased with an increase in temperature, as shown in Figure 2a.…”
Section: Resultsmentioning
confidence: 90%
“…Due to the high growth rate and lack of stacking fault and twin boundary defects during growth, edge-defined film-fed (EFG) techniques have become quite mature to produce large size β-Ga 2 O 3 single crystals. Furthermore, a high-quality n-type β-Ga 2 O 3 epilayer can be grown using a variety of techniques, including metal–organic chemical vapor deposition (MOCVD), halide vapor phase epitaxy (HVPE), and molecular-beam epitaxy (MBE) with controllable doping using shallow donors, Si, Ge, and Sn, in the range of 10 15 to 10 20 cm –3 . …”
Section: Introductionmentioning
confidence: 99%
“…A variety of electronic and optoelectronic devices such as Schottky barrier diodes (SBDs) [ 5 , 6 ] and FETs, including MESFETs, MOSFETs, MODFETs, and HEMTs [ 6 , 7 , 8 , 9 ] based on Ga 2 O 3 bulk single crystals, thin films, and nanostructured materials, have been achieved thanks to the advance in growth and characterization technologies and the unique properties of Ga 2 O 3 . There have been tens of review articles [ 5 , 6 , 7 , 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 , 25 , 26 , 27 , 28 , 29 , 30 , 31 , 32 , 33 , 34 , 35 , 36 , 37 , 38 , 39 , 40 ] concerning Ga 2 O 3 that cover the growth techniques, the physical and chemical properties, and the state-of-the-art device fabrications. Although initial studies on the gas-sensing properties of Ga 2 O 3 thin films were launched by Fleischer and Meixner [ 41 , 42 ] in the early 1990s, few review papers on Ga 2 O 3 -based gas sensors exist in the literature.…”
Section: Introductionmentioning
confidence: 99%