2008
DOI: 10.1295/koron.65.547
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Recent Advances in Transmission Electron Microtomography for Polymer Research

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Cited by 5 publications
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“…Preparation of the ca. 100-nm thick cross-section samples of these nanocomposites by FIB milling requires optimization of ion beam parameters and of masking layers to avoid damaging the sensitive PEM modules. , A layer of evaporated carbon (ca. 20–200 nm) does not significantly perturb the underlying nanocomposite and provides protection during FIB milling.…”
Section: Resultsmentioning
confidence: 99%
“…Preparation of the ca. 100-nm thick cross-section samples of these nanocomposites by FIB milling requires optimization of ion beam parameters and of masking layers to avoid damaging the sensitive PEM modules. , A layer of evaporated carbon (ca. 20–200 nm) does not significantly perturb the underlying nanocomposite and provides protection during FIB milling.…”
Section: Resultsmentioning
confidence: 99%