2020
DOI: 10.3390/polym12051142
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Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Abstract: Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use … Show more

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Cited by 100 publications
(51 citation statements)
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References 165 publications
(246 reference statements)
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“…In addition, advanced electrokinetic characterisation of PEMs provides useful information on electrohydrodynamics of diffuse soft planar interfaces in multilayer films, of which can be used for indirect evaluation of molecular dynamics within PEMs [ 116 ]. Further to this, atomic force microscopy (AFM) paired with Raman and IR spectroscopies have recently emerged as techniques for characterising polymer-based materials at the nanoscale [ 117 ].…”
Section: Analysis Of Polymer Dynamics Inside Pems: Methodsmentioning
confidence: 99%
“…In addition, advanced electrokinetic characterisation of PEMs provides useful information on electrohydrodynamics of diffuse soft planar interfaces in multilayer films, of which can be used for indirect evaluation of molecular dynamics within PEMs [ 116 ]. Further to this, atomic force microscopy (AFM) paired with Raman and IR spectroscopies have recently emerged as techniques for characterising polymer-based materials at the nanoscale [ 117 ].…”
Section: Analysis Of Polymer Dynamics Inside Pems: Methodsmentioning
confidence: 99%
“…The amplitude of this oscillation results in an IR spectrum as a function of the wavenumber. In addition to the IR spectra, the AFM-IR provides IR images, the so-called chemical mapping, with which the individual components can be identified [27][28][29][30][31][32]. The phase morphologies were examined with an Ansys NanoIR3 AFM-IR (Bruker, Billerica, MA, USA).…”
Section: Nanosale Afm-ir Measurementsmentioning
confidence: 99%
“…Advances of AFM-IR and IR s-SNOM technology make it possible to perform IR spectroscopic mapping and chemical analysis at the nanoscale with spatial resolution beyond the Abbe diffraction limit for the characterization of nanomaterials and nanostructures. AFM-IR is now recognized as one of the most important novel techniques for analyzing various systems, such as polymer blends, organic fibers, composites, multilayer thin films in addition to biological samples [ 33 , 34 , 44 ], while IR s-SNOM has demonstrated great popularity in studying monolayered and inorganic samples as well as soft materials [ 35 , 38 , 45 ].…”
Section: Afm-ir and Ir S-snom Application In Cellulose Materialsmentioning
confidence: 99%