1987
DOI: 10.1109/t-ed.1987.23095
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Recombination in highly injected silicon

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Cited by 145 publications
(73 citation statements)
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“…This coefficient is rather independent of material (typically 10 −32 -10 −30 cm 6 /s and it is in the order of 10 −31 for indirect transition in Si and Ge and GaAs [32][33][34][35]. We want to estimate the Auger effect using an approximate model that is material independent, and we therefore set C a = 10 −31 cm 6 /s for all considered materials.…”
Section: Resultsmentioning
confidence: 99%
“…This coefficient is rather independent of material (typically 10 −32 -10 −30 cm 6 /s and it is in the order of 10 −31 for indirect transition in Si and Ge and GaAs [32][33][34][35]. We want to estimate the Auger effect using an approximate model that is material independent, and we therefore set C a = 10 −31 cm 6 /s for all considered materials.…”
Section: Resultsmentioning
confidence: 99%
“…2͑b͔͒, the maximum injection with the flash lamp used is just high enough ͑Ͼ2 ϫ 10 16 cm −3 ͒ to see the onset of the lifetime drop related to a rise of the Auger recombination rate, typical of Si samples. 19 It can be seen in both plots that the effective lifetimes measured show an increase with the Ti dose implanted. The tendency of a lifetime recovery with Ti concentration agrees with the prediction of the NRR suppression when the DL impurity exceeds the delocalization transition.…”
mentioning
confidence: 86%
“…The silicon quality is poorer at the surface and edges compared with the bulk silicon due to the silicon being diced into samples using a diamond saw. The Auger recombination term can be calculated based on equations from Sinton et al [10].…”
Section: B 6 Layer Modelmentioning
confidence: 99%