This paper investigates the prediction of the far-field performances of high frequency projectors using the second source array method (SSAM). The far-field parameters can be calculated accurately using the complex acoustic pressure data of two very close parallel planes which lie in the near-field region of the projector. The paper simulates the feasibility of predicting the far-field parameters such as transmitting voltage response and the far-field directivity pattern. The predicting results are compared with that calculated using boundary element method (BEM). It shows very good agreement between the two methods. A planar high frequency projector is measured using the near-field method. In order to verify the predicting results, the far-field measurement is performed for the same projector. The comparison of the results shows that the near-field method is capable to precisely predict the far-field parameters of the projector.