2013
DOI: 10.1007/s10765-013-1447-6
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Reconstruction of Two-Dimensional Randomly Rough Surfaces Based on Bidirectional Reflectance Distribution Function

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“…In the direct method, we can directly reconstruct the contour information of errors based on the device's electrical properties (Chakrabarti et al, 2013;Cai et al, 2006). But the indirect method provides parameter information rather than the overall contour information of errors (Galdi et al, 2006;El-Shenawee et al, 2009;Xuan et al, 2013). In practical applications, the overall contour information of surface errors affects the transmission losses of a waveguide.…”
Section: Introductionmentioning
confidence: 99%
“…In the direct method, we can directly reconstruct the contour information of errors based on the device's electrical properties (Chakrabarti et al, 2013;Cai et al, 2006). But the indirect method provides parameter information rather than the overall contour information of errors (Galdi et al, 2006;El-Shenawee et al, 2009;Xuan et al, 2013). In practical applications, the overall contour information of surface errors affects the transmission losses of a waveguide.…”
Section: Introductionmentioning
confidence: 99%