2014
DOI: 10.1039/c4ra03502j
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Reduced dielectric loss in Ba0.95Sr0.05(Fe0.5Nb0.5)O3 thin film grown by pulsed laser deposition

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Cited by 9 publications
(5 citation statements)
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“…In the high frequency range, the effects of the vacancies and defects are reduced, leading to merely a slightly higher dielectric constant. It should be noticed that, for the thin film with~200 nm, the dielectric constant (70.1 at 10 6 Hz for the SSCO film with 16% Co doping) obtained in this work was higher than that of other perovskite films such as BaSrO3 (~55.0) and BiFeO3 (~11.6) 25,26 , though a relatively higher dielectric loss (SSCO film: 0.15; BaSrO3 film: 0.09; BiFeO3 film: 0.06) was observed, which may come from the existence of higher concentration of vacancies and defects in the Co doped films.…”
Section: Resultsmentioning
confidence: 51%
See 1 more Smart Citation
“…In the high frequency range, the effects of the vacancies and defects are reduced, leading to merely a slightly higher dielectric constant. It should be noticed that, for the thin film with~200 nm, the dielectric constant (70.1 at 10 6 Hz for the SSCO film with 16% Co doping) obtained in this work was higher than that of other perovskite films such as BaSrO3 (~55.0) and BiFeO3 (~11.6) 25,26 , though a relatively higher dielectric loss (SSCO film: 0.15; BaSrO3 film: 0.09; BiFeO3 film: 0.06) was observed, which may come from the existence of higher concentration of vacancies and defects in the Co doped films.…”
Section: Resultsmentioning
confidence: 51%
“…4(a) shows the dielectric constant-frequency plots of SSCO films in the frequency range of 40-10 7 Hz at room temperature. In the low frequency range below 10000 Hz, the Co-doped films exhibit obviously higher dielectric constant than the undoped one, which may be related to the higher concentration of oxygen va- Vol.32 cancies and other defects in the Co doped films formed in the growth environment via PLD 25 . In the high frequency range, the effects of the vacancies and defects are reduced, leading to merely a slightly higher dielectric constant.…”
Section: Resultsmentioning
confidence: 99%
“…Among them, PLD is a versatile technique to fabricate multicomponent thin lm materials in which raster scanning of high energy pulsed laser ablates the target material and produces the plasma plume. 8,9 The high temperature reaction between ablated ions/ molecules in the plume with the background gas results in scattering, expansion of angular spreading of the plume and then the number of eroded species trying to move towards the substrates. 10 The mean free path of the ablated plume particles in the background gas is strongly depends on the pressure and type of the gas used.…”
Section: Introductionmentioning
confidence: 99%
“…Using the McLean analysis [51,52] the optical band gap can be best described by a direct allowed transition (n = 2) in accordance with Patel at al. [53]. Thus, the optical band gap (E g ) can be determined by plotting Weiss behaviour.…”
Section: Diffuse Reflectance Magnetic and Dielectric Investigationsmentioning
confidence: 99%