INTRODUCTIONExtensive research has been carried out on the deposition and characterization of polycrystalline thin films by several researchers . These materials are used in optical instruments, solar cells, telecommunications terminals, in-vehicle equipment, traffic lights, magnetic films, diamond films, microelectronic devices, solar selective coatings, sensor devices, optical mass memories and superconducting films. In recent years, binary semiconductor material such as zinc telluride has been studied by many scientists. Recent investigations have shown that zinc telluride thin films show absorption in the spectrum range from visible to near infrared (as widely reported in the literature). The II-VI (ZnTe) compound semiconductors have a direct transition at 2.26 eV. Therefore, ZnTe is capable of green light emission at 550 nm, i.e. in spectral region corresponding to the maximum sensitivity of the human eye. This makes ZnTe an appealing candidate for the production of bright light-emitting diodes and diode lasers. There are several reports available on the growth of zinc telluride thin films by different deposition methods such as electro-deposition method [33][34][35] Zinc telluride thin films can be used in a large variety of applications such as optoelectronics and microelectronics tools. In this paper, the growth of ZnTe films prepared by electrodeposition, thermal evaporation and closed space sublimation method with various precursors and some its physical properties of obtained zinc telluride films are discussed.