2011
DOI: 10.1016/j.jcrysgro.2011.06.010
|View full text |Cite
|
Sign up to set email alerts
|

Reduction of oxygen impurity at GaN/β-Si3N4/Si interface via SiO2 to Ga2O conversion by exposing of Si surface under Ga flux

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

1
2
0

Year Published

2013
2013
2019
2019

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 20 publications
1
2
0
Order By: Relevance
“…Like in our analysis above, the low sticking of Ga adatoms on the substrate at high T d can be attributed to desorption of Ga and/or Ga 2 O from the SiO x surface. In fact, the onset of Ga loss from the substrate surface at T d ≈ 520 °C is in agreement with what has been reported for Ga 2 O by Kumar et al 36 using in situ residual gas analyzer measurements. Nevertheless, desorption of Ga in parallel to that of Ga 2 O cannot be ruled out.…”
Section: ■ Results and Discussionsupporting
confidence: 91%
See 2 more Smart Citations
“…Like in our analysis above, the low sticking of Ga adatoms on the substrate at high T d can be attributed to desorption of Ga and/or Ga 2 O from the SiO x surface. In fact, the onset of Ga loss from the substrate surface at T d ≈ 520 °C is in agreement with what has been reported for Ga 2 O by Kumar et al 36 using in situ residual gas analyzer measurements. Nevertheless, desorption of Ga in parallel to that of Ga 2 O cannot be ruled out.…”
Section: ■ Results and Discussionsupporting
confidence: 91%
“…In fact, only a very small portion of the deposited Ga atoms remained on the substrate surface at low T a1 (0.01% at 690 °C), whereas this portion increased at higher T a1 (10% at 770 °C). This significant loss of deposited Ga from the SiO x surface can be attributed to desorption of Ga adatoms , and/or Ga 2 O molecules . The latter is the product of the chemical reaction between Ga adatoms and O atoms from the SiO x layer.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation