Ultraviolet GaN photodetectors based on nanowires (NWs)
fabricated
by top-down strategies promise improved uniformity, morphology, and
doping control with respect to bottom-up ones. However, exploiting
the advantages of the NW geometry requires sub-wavelength NW diameters.
We present fabrication of large-area sub-200 nm diameter top-down
GaN p–i–n NW ultraviolet photodetectors with lengths over 2 μm produced
from a planar specimen using nanosphere lithography, followed by a
combination of dry and crystallographic-selective wet etching. Photocurrent
measurements in single-NW devices under bias show a linear response
as a function of the optical power, with increased current levels
under reverse bias. The linearity proves that the drift of photogenerated
carriers at the junction is the dominating photodetection mechanism,
with negligible contributions from surface effects. These results
demonstrate that the unique properties of NW-based photodetectors
can be assessed through a scalable and low-cost fabrication process.