Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

Metal coatings provide products with the necessary technical characteristics; in particular, they increase corrosion resistance and protect against mechanical abrasion. The application of metal coatings is a promising direction and is widely used in mechanical engineering, metallurgy, and other industries. Therefore, studying the properties and improving the technology of applying metal coatings is a significant and sought-after line of activity for metrology researchers. The needs of industry in the field of monitoring the parameters of single-layer and single-component coatings in the Russian Federation are fully satisfied. At the beginning of this study, the Federal Information Fund for Ensuring the Uniformity of Measurements provided a comprehensive list of reference materials of surface density and thickness of single-layer onecomponent coatings that were tested using the State Primary Standard for units of surface density and mass fraction of elements in coatings GET 168-2015. The needs for testing, verification, and calibration of instruments for measuring surface density, thickness, and chemical composition of multilayer and multicomponent coatings remained not fully met, which became the starting point for this research.The research presented in the article was carried out in order to develop methods for determining the surface density and mass fraction of elements for multilayer and multicomponent coatings on GET 168-2015. At the same time, the problem of developing a set of reference materials of surface density and mass fraction of elements in two-layer and two-component coatings for metrological support of the corresponding measuring instruments was solved.The article fully reveals the content of the work to improve metrological support for measuring surface density, thickness, and mass fraction of elements in coatings, taking into account the needs of industry in the field of monitoring coating parameters and the variety of measurement tasks that are constantly expanding.

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Reference-free X-ray fluorescence analysis using well-known polychromatic synchrotron radiation

Abstract: A reliable and reference-free X-ray fluorescence (XRF) analysis can be achieved by using accurate knowledge of the spectral distribution of the polychromatic excitation source.

Cited by 2 publications

References 54 publications

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Research, Development and Implementation of Methods for Determining Surface Density and Mass Fraction of Elements for Multilayer and Multicomponent Coatings by X-Ray Fluorescence Method

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