2022
DOI: 10.1107/s2052252522006844
|View full text |Cite
|
Sign up to set email alerts
|

Refinement of anomalous dispersion correction parameters in single-crystal structure determinations

Abstract: Correcting for anomalous dispersion is part of any refinement of an X-ray diffraction crystal structure determination. The procedure takes the inelastic scattering in the diffraction experiment into account. This X-ray absorption effect is specific to each chemical compound and is particularly sensitive to radiation energies in the region of the absorption edges of the elements in the compound. Therefore, the widely used tabulated values for these corrections can only be approximations as they are based on cal… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
4
0
1

Year Published

2023
2023
2024
2024

Publication Types

Select...
5
2

Relationship

1
6

Authors

Journals

citations
Cited by 9 publications
(6 citation statements)
references
References 54 publications
1
4
0
1
Order By: Relevance
“…Bodensteiner et al zeigten mit Röntgenabsorptionsspektren, dass besonders bei Einkristallstrukturbestimmungen mit einer Wellenlänge nahe an der Absorptionskante von Metallatomen diese Werte deutlich von den tabellierten Werten abweichen, während sie durch eine Verfeinerung gut angenähert werden. 57) Derartige Verfeinerungen sind inzwischen in Olex2 implementiert. 58) Auf Hardwareseite wurde ein Metaljet mit Indiumstrahlung eingesetzt.…”
Section: Georg Steinhauser Institut Für Angewandteunclassified
“…Bodensteiner et al zeigten mit Röntgenabsorptionsspektren, dass besonders bei Einkristallstrukturbestimmungen mit einer Wellenlänge nahe an der Absorptionskante von Metallatomen diese Werte deutlich von den tabellierten Werten abweichen, während sie durch eine Verfeinerung gut angenähert werden. 57) Derartige Verfeinerungen sind inzwischen in Olex2 implementiert. 58) Auf Hardwareseite wurde ein Metaljet mit Indiumstrahlung eingesetzt.…”
Section: Georg Steinhauser Institut Für Angewandteunclassified
“…The authors have cited additional references within the Supporting Information. [39][40][41][42][43][44][45][46][47][48][49][50][51] Deposition Number(s) ; 2300961 (for XRW-MoKa), 2300962 (for XRW-CuKb), 2300963 (for MM-MoKa), 2300838 (for MM-CuKb 2305139 (for HAR-MoKa), 2305140 (for HAR-CuKb), 2305141 (for NiP3_100 K), 2305142 (for NiP3_150 K), 2305143 (for NiP3_200 K), 2300862 (for NiP3_ 250 K) contain(s) the supplementary crystallographic data for this paper. These data are provided free of charge by the joint Cambridge Crystallographic Data Centre and Fachinformationszentrum Karlsruhe Access Structures service.…”
Section: Supporting Informationmentioning
confidence: 99%
“…The authors have cited additional references within the Supporting Information [39–51] . Deposition Number(s) ; 2300961 (for XRW‐MoKa), 2300962 (for XRW‐CuKb), 2300963 (for MM–MoKa), 2300838 (for MM–CuKb 2305139 (for HAR‐MoKa), 2305140 (for HAR‐CuKb), 2305141 (for NiP3_100 K), 2305142 (for NiP3_150 K), 2305143 (for NiP3_200 K), 2300862 (for NiP3_250 K) contain(s) the supplementary crystallographic data for this paper.…”
Section: Supporting Informationmentioning
confidence: 99%
“…Last but not least, one should also acknowledge the latest works of the Bodensteiner group (Meurer et al, 2022) on anomalous dispersion corrections, and of Volkov and colleagues (Olukayode et al, 2023) on the revision of relativistic Dirac-Hartree-Fock X-ray scattering factors of neutral atoms. Although both advancements are not directly related with the Hansen-Coppens multipole model, they provided essential information for the interpretation and analysis of X-ray diffraction patterns, which are of great importance in terms of high-resolution data.…”
Section: Multipole Model-based Techniquesmentioning
confidence: 99%