1982
DOI: 10.1364/ao.21.001854
|View full text |Cite
|
Sign up to set email alerts
|

Refining method for the design of multilayer stacks

Abstract: An analytical procedure is presented for the calculation of the maximum of transmittance in a limited spectral region and of the efficiency of a given multilayer configuration when the thickness is altered of certain films in the stack. This refining process method is employed in examples where the spectral transmittance is improved when only a few matching layers are used for refining.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

0
4
0

Year Published

1982
1982
2019
2019

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 8 publications
0
4
0
Order By: Relevance
“…of a thin film. 2,3,4,5 Reflectance and transmittance of an optical filter can be calculated by using the 2x2 matrix of the multilayer structure surrounded by two substrates. 3 For this study, a Matlab code computer program, 6 which calculates reflectance and transmittance, was prepared using the matrix representation method of a multilayer structure.…”
Section: Sensitivity Analysismentioning
confidence: 99%
See 2 more Smart Citations
“…of a thin film. 2,3,4,5 Reflectance and transmittance of an optical filter can be calculated by using the 2x2 matrix of the multilayer structure surrounded by two substrates. 3 For this study, a Matlab code computer program, 6 which calculates reflectance and transmittance, was prepared using the matrix representation method of a multilayer structure.…”
Section: Sensitivity Analysismentioning
confidence: 99%
“…Sensitivity is often related to errors that are induced during the manufacturing process, as a result of human or instrumental error, as one loses control of precision. 4,7 Hence, it is useful to study the sensitivity factor, as it has a significant effect on the final spectral performance of the manufactured thin film. The optical thin film parameters that are prone to error are the physical thickness and the refractive index.…”
Section: Sensitivity Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…Specifically, the genetic algorithm was successfully used in the design of multilayered cylindrical structures with super-scattering or cloaking performance [14,15]. When an initial design is available, refinement methods may be an easier alternative [16]. Thanks to Bohr's model, we obtained the initial designs and later we refined them straightforwardly.…”
Section: Introductionmentioning
confidence: 99%