1989
DOI: 10.1016/0257-8972(89)90070-4
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Reflection-diffraction x-ray diffraction depth profiling of reactively sputtered highly oriented TiN on MgO

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Cited by 3 publications
(1 citation statement)
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“…It is not a particle in the sense in which we picture a particle, or even a fuzzy sphere moving at the speed of light. But we can register single photons and do so in, for example, x-ray diffraction studies of surfaces (Helrich et al 1989). In some measurements we may register only a few photons per minute at a detector.…”
Section: The Measurementmentioning
confidence: 99%
“…It is not a particle in the sense in which we picture a particle, or even a fuzzy sphere moving at the speed of light. But we can register single photons and do so in, for example, x-ray diffraction studies of surfaces (Helrich et al 1989). In some measurements we may register only a few photons per minute at a detector.…”
Section: The Measurementmentioning
confidence: 99%