Reflection Properties of a Biaxially Anisotropic Dielectric Film in a Long-Wavelength Approximation

Abstract

Abstract-The reflection of linearly polarized light from an ultrathin biaxially anisotropic dielectric film on an isotropic transparent material is investigated in the long-wavelength limit.The approximate expressions for the reflection characteristics of s-and p-polarized electromagnetic plane waves are obtained. The analytical approach developed in this paper not only provides insight into the nature of reflection problem for biaxially anisotropic ultrathin films but also furnishes the methods for resolving the inverse problem for such anisotropic layers. It is shown that a key capability of the developed analytical method is to decouple the usual correlations in the index and the thickness of ultrathin films.

Reflection and Transmission From Biaxially Anisotropic-Isotropic Interfaces

“…The effect of rotation on the layered case is similar to the halfspace case in that double reflection and refraction is observed and the dominant reflected wave changes as a function of angle of incidence. In the case of the layered medium, we have defined a biaxial layer of any arbitrary thickness going beyond the thin film definitions in [14]. The wave formulation method of determining reflection and transmission characteristics at isotropic-biaxial interfaces provides straightforward theoretical analysis of biaxial media.…”