Reflective Infrared Ellipsometry of Plastic Films

Folks, William R.; Pandey, Sidhartha K.; Pribil, Greg K.; Slafer, Dennis; Manning, Monis J.; Boreman, Glenn D.

doi:10.1007/s10762-006-9150-3

Cited by 11 publications

(14 citation statements)

References 7 publications

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“…Infrared spectroscopic ellipsometry of polystyrene films has been reported previously, and the real and imaginary optical constants are available for quantitative comparison. Folks et al 27,28 give the values of the imaginary index for polystyrene to be 0.0371 and 0.0609 at the wavelengths of Fig. 3, making our estimates of the index using the simplified method just given in error by À6% and À7%, respectively, for the bands at 2923.6 cm À1 and 1492.7 cm À1 .…”

Section: Resultsmentioning

confidence: 98%

“…A useful view of these data can be obtained by normalizing each spectrum (the Fig. 4 spectrum and the ''spectrum'' determined by Folk et al) 27,28 to the 2923.6 cm À1 absorption band. Figure 5 shows a plot of the ratios of intensities of seven major absorption bands, the ratio being defined as the normalized intensity of the band in Fig.…”

Section: Resultsmentioning

confidence: 99%

“…Mie absorption cross-section 21,27,28 6. The relative peak intensities of (A) the baseline-subtracted reflectance spectrum of polystyrene spheres at sub-monolayer coverage and (B) the absorption spectrum of a polystyrene thin film show that the intensities drop as a function of wavelength in reflectance measurements on a metal substrate, which is consistent with our hypothesis of EFSW effects on the reflectance spectrum.…”

Section: Vibration Frequencymentioning

confidence: 99%

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A Study of Electric Field Standing Waves on Reflection Microspectroscopy of Polystyrene Particles

et al. 2009

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We have been investigating the mid-infrared (MIR) reflection spectrum of microparticles on mirrored substrates. Gold-coated porous alumina filters were used as a substrate to layer the particles and provide consistent reflection spectra. Polystyrene spheres with measured diameters of 0.42 microm were studied using Fourier transform infrared (FT-IR) reflection microspectroscopy, and spectra are shown for coverages in the range 0.5-6 monolayers (ML). Results show that absorption has a nonlinear, stairstep-like dependence on particle coverage and a wavelength dependence that can be explained by electric field standing waves (EFSW) caused by the mirrored substrate. The same effect is found to cause progressive weakening of the observed spectra as a function of increasing wavelength in sub-monolayer coverage measurements. Scattering effects in the spectra are consistent with surface scattering at the antinodes of the EFSW. These observations provide explanations for differences seen between optical properties of particles calculated using the specular-reflection method versus those calculated using traditional aerosol methods. A simple multilayer method for estimating particle absorption coefficients is demonstrated that compares well with values reported using ellipsometry for bulk polystyrene. Another simple method based on submonolayer coverage spectra provides spectra suitable for classification analysis but is only semi-quantitative at determining absorption coefficients.

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Section: Resultsmentioning

confidence: 98%

Section: Resultsmentioning

confidence: 99%

Section: Vibration Frequencymentioning

confidence: 99%

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A Study of Electric Field Standing Waves on Reflection Microspectroscopy of Polystyrene Particles

et al. 2009

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“…1 Introduction In this article infrared reflective ellipsometry (refl-SE) [1,2] is used to determine room temperature optical constants in the infrared for a variety of common materials used in micro-electronic device fabrication. There are many excellent texts which review the fundamentals of the technique [3,4].…”

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confidence: 99%

Spectroscopic ellipsometry of materials for infrared micro‐device fabrication

Folks

Ginn

Shelton

et al. 2008

Phys. Status Solidi (c)

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For many common types of process materials used in the fabrication of infrared microelectronic devices there is a lack of information available in the literature regarding their thin‐film optical properties over the wavelength range of 2 to 30 micrometers. In this article, spectroscopic ellipsometry is used to determine room‐temperature optical constants in the infrared for a variety of organic and inorganic coatings commonly used in fabrication. Examples include coatings used for photolithography, coating, passivation, planarization, index matching, and stand‐off. Applications include infrared frequency selective surfaces, antennas, micro‐displays, and flexible substrates. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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“…[37,38], Refs. [39,40], and Refs. [41,42], accordingly, whereas for glycerol, oscillator models extracted from Ref.…”

Section: Theoretical Formalismmentioning

confidence: 99%

Optical interference effects on the Casimir-Lifshitz force in multilayer structures

2020

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The Casimir-Lifshitz force F (C−L) between planar objects when one of them is stratified at the nanoscale is herein investigated. Layering results in optical interference effects that give rise to a modification of the optical losses, which, as stated by the fluctuation-dissipation theorem, should affect the Casimir-Lifshitz interaction. On these grounds, we demonstrate that, by nanostructuring the same volume of dielectric materials in diverse multilayer configurations, it is possible to access F (C−L) of attractive or repulsive nature, even getting cancelled, at specific separation distances.

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Reflective Infrared Ellipsometry of Plastic Films

Cited by 11 publications

References 7 publications

A Study of Electric Field Standing Waves on Reflection Microspectroscopy of Polystyrene Particles

A Study of Electric Field Standing Waves on Reflection Microspectroscopy of Polystyrene Particles

Spectroscopic ellipsometry of materials for infrared micro‐device fabrication

Optical interference effects on the Casimir-Lifshitz force in multilayer structures

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