Refraction index sensor based on phase resonances in a subwavelength structure with double period

Abstract

In this paper, we numerically demonstrate a refraction index sensor based on phase resonance excitation in a subwavelength-slit structure with a double period. The sensor consists of a metal layer with subwavelength slots arranged in a bi-periodic form, separated from a high refraction index medium. Between the metallic structure and the incident medium, a dielectric waveguide is formed whose refraction index is going to be determined. Variations in the refraction index of the waveguide are detected as shifts in the peaks of transmitted intensity originated by resonant modes supported by the compound metallic structure. At normal incidence, the spectral position of these resonant peaks exhibits a linear or a quadratic dependence with the refraction index, which permits us to obtain the unknown refraction index value with a high precision for a wide range of wavelengths. Since the operating principle of the sensor is due to the morphological resonances of the slits' structure, this device can be scaled to operate in different wavelength ranges while keeping similar characteristics.