Proceedings of the 2013 IEEE/SICE International Symposium on System Integration 2013
DOI: 10.1109/sii.2013.6776608
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Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography

Abstract: The measurement method of a refractive index distribution and a physical thickness distribution using digital holography with a low-coherent light source is proposed. The introduction of a datum plane enables the simultaneous measurement of a refractive index and a physical thickness distributions. By the optical experiments, the potential of the proposed method is confirmed. For the reduction of measurement time, the relation between stepping intervals of a reference mirror and measurement results are also di… Show more

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Cited by 4 publications
(1 citation statement)
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“…We have proposed the system to obtain refractive index and thickness distributions from Fresnel holograms recorded by a temporally low-coherent light source. 1,2 On the other hand, spatially incoherent holography has been widely studied in recent years. [3][4][5][6][7] In the methods, a hologram of the spatially incoherent object (incoherently illuminated or self-luminous object) can be recorded.…”
Section: Introductionmentioning
confidence: 99%
“…We have proposed the system to obtain refractive index and thickness distributions from Fresnel holograms recorded by a temporally low-coherent light source. 1,2 On the other hand, spatially incoherent holography has been widely studied in recent years. [3][4][5][6][7] In the methods, a hologram of the spatially incoherent object (incoherently illuminated or self-luminous object) can be recorded.…”
Section: Introductionmentioning
confidence: 99%