“…For that purpose, refractometry techniques were employed to measure n s , while the evaluation of n f was carried out by means the Longitudinal Section Electric (LSE) (E x pq and quasi-TE) and Longitudinal Section Magnetic (LSM) (E y pq and quasi-TM) guided modes formulation, which was specifically developed by the authors in order to calculate refraction index and thickness of polymeric microlayers [11]. E x pq (quasi-TE) and E y pq (quasi-TM) guided modes in CPOWEG were simulated.…”