2012
DOI: 10.1143/jjap.51.11pd03
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Refractive Index Measurements of Well-Defined Polygon Crystals of Thiophene/Phenylene Co-Oligomers

Abstract: We have improved the crystal growth methods of thiophene/phenylene co-oligomers (TPCOs). The crystal growth was carried out in a liquid phase. The resulting crystals were well defined in thin polygons with several pairs of parallel crystal faces that function as optical mirrors. This produces interference fringes in the emission and reflectance spectra, enabling us to determine the anisotropic refractive indices. From among TPCOs we chose 5,5 0 -bis(4-biphenylyl)-2,2 0 -bithiophene (BP2T) and its methoxy deriv… Show more

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Cited by 12 publications
(45 citation statements)
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(88 reference statements)
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“…For measurements we laminated the crystals on a silicon wafer substrate covered with a silicon dioxide layer of 300 nm in thickness. We observed the size and shape of the crystals using a NIKON ECLIPSE LV100POL polarizing microscope with an EXFO X-Cite 120 mercury lamp (white light: 294.5 to 812.5 nm) [13]. Thickness measurements and X-ray diffraction (XRD) measurements were performed in the manner same as before [17].…”
Section: Methodsmentioning
confidence: 99%
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“…For measurements we laminated the crystals on a silicon wafer substrate covered with a silicon dioxide layer of 300 nm in thickness. We observed the size and shape of the crystals using a NIKON ECLIPSE LV100POL polarizing microscope with an EXFO X-Cite 120 mercury lamp (white light: 294.5 to 812.5 nm) [13]. Thickness measurements and X-ray diffraction (XRD) measurements were performed in the manner same as before [17].…”
Section: Methodsmentioning
confidence: 99%
“…We measured the interference fringes in both the reflectance and emission spectra using the methods described in the literature [11][12][13]. For both the measurements we irradiated incident lights perpendicularly to the substrate plane.…”
Section: Methodsmentioning
confidence: 99%
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