Refractive Index Resolved Imaging Enabled by Terahertz Time-Domain Spectroscopy Ellipsometry

Abstract

Material characterization in the terahertz range is an interesting topic of research due to its great applications in material science, health monitoring, and security applications. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power, and signal-to-noise ratio. This enables advanced material characterization methods such as ellipsometry, which has been little explored in the terahertz frequency range, yet. Here, we introduce a comparison between material characterization with terahertz time-domain spectroscopy in transmission geometry and ellipsometry reflection geometry. Terahertz ellipsometry images were taken, showing spatially resolved refractive index estimation in the far field and higher image quality compared to single-polarization imaging.