2006
DOI: 10.1541/ieejfms.126.105
|View full text |Cite
|
Sign up to set email alerts
|

Relation between Grain Boundary and Electrical Degradation of ZnO Varistors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

0
11
0

Year Published

2007
2007
2012
2012

Publication Types

Select...
5

Relationship

4
1

Authors

Journals

citations
Cited by 9 publications
(11 citation statements)
references
References 9 publications
0
11
0
Order By: Relevance
“…In contrast, it has been reported that the crystal structure of Bi 2 O 3 at grain boundaries changes to the α, γ, or δ-type structure owning to the composition of impurities added or the sintering and annealing conditions. [8][9][10]16,[19][20][21] However, in this study, it was found that the degree of electrical degradation is related to other factors in Fig. 8.…”
Section: Relationship Between Change In Orientation Of Zno Grains Caumentioning
confidence: 49%
See 3 more Smart Citations
“…In contrast, it has been reported that the crystal structure of Bi 2 O 3 at grain boundaries changes to the α, γ, or δ-type structure owning to the composition of impurities added or the sintering and annealing conditions. [8][9][10]16,[19][20][21] However, in this study, it was found that the degree of electrical degradation is related to other factors in Fig. 8.…”
Section: Relationship Between Change In Orientation Of Zno Grains Caumentioning
confidence: 49%
“…Furthermore, it has been reported that the electrical degradation characteristics of samples with 0.1 mol% Sb 2 O 3 or less is correlated to the orientation of ZnO grains; this is because the mobility of oxide ions or Zn 2+ ions depends on the orientation of ZnO grains. 9,10 Fig. 4 shows the relative integral intensity of the diffraction peak for the (0 0 4) plane of ZnO grains of Sb 2 O 3 -added samples before and after annealing.…”
Section: Relationship Between Change In Orientation Of Zno Grains Caumentioning
confidence: 99%
See 2 more Smart Citations
“…Relative integral intensity of (004) plane 2.0 The mechanism of the non-ohmic property of ZnO visitors has been explained using energy-band model of double Schottky barriers formed at grain boundaries of ZnO grains. Moreover, it is reported that one of the mechanism of the electrical degradation is due to the diffusion of oxygen ions through the grain boundary caused by application of bias voltage and then double Schottky barriers are distorted by the re-distribution of electrons and holes near the grain boundary (1) (2) . It is known that ZnO varistors with containing of Sb 2 O 3 obtained excellent properties, such as high varistor voltage, improvement of the uniformity of the grain size and improvement of the electrical degradation characteristics (2) .…”
mentioning
confidence: 99%