2000
DOI: 10.1143/jjap.39.4912
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Relation between the Radius of Tip Curvature and the Light Emission Efficiency from Scanning Tunneling Microscope

Abstract: The relation between the efficiency of scanning tunneling microscope light emission (STM-LE) and the radius of tip curvature has been studied using silver tips. The emission efficiency increases with decreasing radius of tip curvature ρ for ρ>80 nm. This result agrees qualitatively with the prediction of a theory that includes the effect of electromagnetic retardation.

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Cited by 9 publications
(1 citation statement)
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“…Many observations are consistent with a picture of light emitted by junction plasmons that are excited by the tunneling electrons as the source of the observed emission. 4,10,[197][198][199][200][201][202][203][204][205][206][207][208] This interpretation is supported by a substantial body of theoretical work. [209][210][211][212][213][214][215] Obviously, other fluorescent modes can also be excited.…”
Section: Light Emission From Current Carrying Junctionsmentioning
confidence: 79%
“…Many observations are consistent with a picture of light emitted by junction plasmons that are excited by the tunneling electrons as the source of the observed emission. 4,10,[197][198][199][200][201][202][203][204][205][206][207][208] This interpretation is supported by a substantial body of theoretical work. [209][210][211][212][213][214][215] Obviously, other fluorescent modes can also be excited.…”
Section: Light Emission From Current Carrying Junctionsmentioning
confidence: 79%