1975
DOI: 10.1107/s0567739475000782
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Relations between integrated intensities in crystal diffraction methods for X-rays and neutrons

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Cited by 42 publications
(22 citation statements)
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“…In particular, the argument above can be repeated for time-of-flight neutron powder diffraction at fixed angle. The intensities in this case are simply related to those obtained in fixed-wavelength powder diffraction (Buras & Gerward, 1975). It can be shown that the scale factors obtained from Rietveld analysis of timeof-flight data [with multiphase versions of programs such as that described by Von Dreele, Jorgensen & *We note that a rather similar relationship has been given by Werner et al (1979), but it lacks the unit-cell volume V r an omission which we cannot understand.…”
Section: Sp W Mp/( Zpm Pvp)mentioning
confidence: 91%
“…In particular, the argument above can be repeated for time-of-flight neutron powder diffraction at fixed angle. The intensities in this case are simply related to those obtained in fixed-wavelength powder diffraction (Buras & Gerward, 1975). It can be shown that the scale factors obtained from Rietveld analysis of timeof-flight data [with multiphase versions of programs such as that described by Von Dreele, Jorgensen & *We note that a rather similar relationship has been given by Werner et al (1979), but it lacks the unit-cell volume V r an omission which we cannot understand.…”
Section: Sp W Mp/( Zpm Pvp)mentioning
confidence: 91%
“…The Laue method (Friedrich, Knipping & yon Laue, 1912) gained new popularity in the 1970's (Tuomi, Naukkarinen & Rabe, 1974;Buras & Gerward, 1975;Steinberger, Bordas & Kalman, 1977) when synchrotron radiation became widely available for structural studies (Rosembaum, Holmes & Witz, 1971). This, along with developments in computational techniques to process Laue diffraction data (Wood, Thompson & Matthewman, 1983;Machin, 1985Machin, , 1987Campbell, Habash, Moffat & Helliwell, 1986;Clifton et al, 1985;Campbell et al, 1987;Rabinovich & Lourie, 1987;Cruickshank, Helliwell & Moffat, 1987HelliweU et al, 1989;), led to an expansion in the use of the Laue technique.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, these crystals have a brief lifetime when exposed to x-radiation. We therefore investigated the potential of the fast and efficient Laue data collection method (34)(35)(36) to obtain data of adequate quality to proceed with the crystal structure determination.…”
Section: Resultsmentioning
confidence: 99%