Relationship between charge distribution and its image by electrostatic force microscopy

Lambert, J.; Guthmann, C.; Saint-Jean, M.

doi:10.1063/1.1559411

Cited by 34 publications

(22 citation statements)

References 13 publications

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“…Over the years, EFM has successfully performed characterizations on a variety of electrostatic phenomena such as surface potential 50 and doping concentration in semiconductors 51 . In addition, EFM has been used in more specific cases, some of which include imaging the voltage characteristics of working microelectronic devices and in charge injection and detection of localized charge in nanostructures 52 .…”

Section: ) Electric Force Microscopymentioning

confidence: 99%

Charge-Selective Raman Scattering and Fluorescence Quenching by “Nanometal On Semiconductor” Substrates

Bhatt

Tan²,

Karumuri³

et al. 2010

Nano Lett.

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Ag nanoparticles synthesized on n and p-type Si were shown to exhibit charge-selective surface-enhanced Raman scattering and fluorescence quenching. As revealed by electric force microscopy, the polarity and magnitude of the nanoparticle charge is controllable with the metal-semiconductor Fermi level difference and nanoparticle size. It is inferred that the Fermi level alignment is dominantly contributed by the charge-induced nanoparticle voltage. Nanoparticle charging also accounts for self-inhibition of coalescence during chemical reduction, allowing strong plasmon hybridization.

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Section: ) Electric Force Microscopymentioning

confidence: 99%

Charge-Selective Raman Scattering and Fluorescence Quenching by “Nanometal On Semiconductor” Substrates

Bhatt

Tan²,

Karumuri³

et al. 2010

Nano Lett.

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“…This order of magnitude of charge spreading (see Fig. 2-a3) is typical of charge injection in a dielectric insulating layer (here the OTS and SiO 2 layers) and is due to a non-zero in-plane electric field induced by the tip during the injection [11]. In the case method B (Fig.…”

mentioning

confidence: 99%

Localization and delocalization of charges injected in DNA

Heim

Mélin

Deresmes

et al. 2004

Applied Physics Letters

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The electrical properties of DNA molecules are investigated by charge injection and electric force microscopy experiments. Prior to injection, DNA molecules exhibit a weak positively charged state. We probe the electrical behaviour of DNA by measuring the localized or delocalized character of the DNA charge states upon injection of excess charges. We show that injected charges do not delocalize for overstretched DNA prepared by a receding meniscus technique, while the adjunction of spermidine during the deposition leads to relaxed DNA molecules exhibiting a charge delocalization over microns. The interplay between charge localization/delocalization and deposition techniques may explain that transport behaviors ranging from insulating to conductive have been reported for DNA deposited on surfaces.85.65.+h, 87.14.Gg, 87.64.Dz, 68.37.Ps

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“…The possibility to quantify stored charge density by EFM has been well documented [7][8][9]. However, recent studies provide a nuanced view of the EFM procedure, namely arguing its sensitivity to applied bias during the measurements and its accuracy limitation caused by image charge effects [10,11]. To overcome these adverse effects, KFM technique tended to be preferred as it directly provides potential measurements [12][13][14].…”

Section: Introductionmentioning

confidence: 98%

Space charge probing in dielectrics at nanometer scale by techniques derived from atomic force microscopy

Villeneuve

Teyssèdre

Mortreuil

et al. 2013

2013 IEEE International Conference on Solid Dielectrics (ICSD)

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Charges accumulation and injection in dielectric material remains critical because it is related to a lot of applications or issues. A deep understanding of interfaces phenomena is needed, but classical space charges techniques exhibit less resolution than the required one. Atomic Force Microscopy (AFM) because of its sensitivity to electrostatic force and its high resolution (close to nanometer) appears to be the best method to characterize charges at nanoscale. Here, two techniques are investigated and compare: Kelvin Force Microscopy (KFM) and Electrostatic Force Distance Curve (EFDC). KFM is used to measured surface potential modification induced by charges. However vertical localization of charges seems difficult to attempt. EFDC follows electrostatic force as function of tip-surface distance. This technique appears promising because of its high resolution, sensitivity to charges localization and distance dependance.

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Relationship between charge distribution and its image by electrostatic force microscopy

Cited by 34 publications

References 13 publications

Charge-Selective Raman Scattering and Fluorescence Quenching by “Nanometal On Semiconductor” Substrates

Charge-Selective Raman Scattering and Fluorescence Quenching by “Nanometal On Semiconductor” Substrates

Localization and delocalization of charges injected in DNA

Space charge probing in dielectrics at nanometer scale by techniques derived from atomic force microscopy

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