2000
DOI: 10.1016/s0038-1098(00)00156-3
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Relaxation characteristics of NiGaxFe2−xO4

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Cited by 10 publications
(4 citation statements)
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“…A loss peak is observed for all studied compositions. It was pointed out that [15] the appearance of such peak in tan δ versus frequency curve can be attributed to the strong correlation between the hopping conduction mechanism and dielectric behavior of the ferrites (i.e. the cation-cation correlation at the B-site).…”
Section: The Frequency Dependence Of (ε ) and Loss Tangent (Tan δ)mentioning
confidence: 99%
“…A loss peak is observed for all studied compositions. It was pointed out that [15] the appearance of such peak in tan δ versus frequency curve can be attributed to the strong correlation between the hopping conduction mechanism and dielectric behavior of the ferrites (i.e. the cation-cation correlation at the B-site).…”
Section: The Frequency Dependence Of (ε ) and Loss Tangent (Tan δ)mentioning
confidence: 99%
“…It can be seen also that tan ı versus frequency sometimes shows maxima. These maxima of tan ı as a function of frequency in ferrites are attributed to the coincidence of the hopping frequency of electrons with the frequency of the externally applied field [23][24][25]. The high values of losses may be very important in some future applications that depend mainly on the thermal effect of the losses.…”
Section: Resultsmentioning
confidence: 98%
“…It is clear that tanδ (f) for some samples has a relaxation loss peaks at certain frequencies (samples BA7 and KH7). Such peaks were observed before in many kinds of semiconductors when the hopping frequency of the charge carriers nearly equal to that of the external electric field [13] [14]. The condition of observing dielectric loss peak can be written as 2πf max τ = 1, where τ is the relaxation time (relaxation time has an inverse proportional with hopping probability) and f max is the frequency of applied electric field at maximum frequency (i.e.…”
Section: Dielectric Behaviormentioning
confidence: 90%