(1−x)PbZrO3–xSrTiO3 (x: 10, 20, and 30 mol %) ceramics were prepared by a conventional mixed‐oxide solid‐state reaction method. The relaxer behaviors of the PbZrO3–SrTiO3 ceramics were examined in the temperature range of 120–523 K. A broad dielectric maximum that shifted to higher temperature with increasing frequency signified the relaxer‐type behaviors of these ceramics. The value of the relaxation parameter of γ=1.73, estimated from the linear fit of the modified Curie–Weiss law, indicated the relaxer nature. High‐temperature dielectric relaxation phenomena were found in the temperature region of 600‐850 K. The activation energy, calculated from impedance measurements of samples, suggested that the dielectric relaxation was a result of oxygen vacancies generated during the sintering process. The energy‐storage density calculated from hysteresis loops reached about 0.46 J cm−3 for the PSZT30 ceramic at room temperature.