2006
DOI: 10.1063/1.2400393
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Relevance of surface roughness to tungsten sputtering and carbon implantation

Abstract: Tungsten sputtering and carbon layer growth by carbon ion bombardment has been investigated by experiments with thin W layers. Preparation of tungsten layers by magnetron deposition allows one to control the surface roughness by choosing appropriate substrates.The fluence dependent elemental composition of the bombarded surface has been studied insitu with ion beam analysis allowing separate measurements of the areal densities of tungsten and carbon atoms. In contrast to weight-loss measurements, this approach… Show more

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Cited by 23 publications
(26 citation statements)
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“…For example, a good agreement between simulation and experiment has been observed in [4], where the implantation of C + ions in a tungsten surface has been investigated. The well-known TRIDYN code [5] has been used for simulation of erosion yields and depth profiles.…”
Section: Introductionmentioning
confidence: 80%
“…For example, a good agreement between simulation and experiment has been observed in [4], where the implantation of C + ions in a tungsten surface has been investigated. The well-known TRIDYN code [5] has been used for simulation of erosion yields and depth profiles.…”
Section: Introductionmentioning
confidence: 80%
“…The influence of surface roughness and surface cleanliness was quantified and minimized, and the effect of non-uniform bombardment was eliminated by replacing in-situ weight-loss measurements with in-situ ion beam analysis [7]. These improvements have allowed to achieve good quantitative agreement between experimental results and simulations in case of smooth surfaces.…”
Section: Introductionmentioning
confidence: 94%
“…This work discusses previously performed experiments [7] comparing the experimental data and SDTrimSP-2D simulations. In addition to data presented in [7], new data of the respective experiments obtained by atomic force microscopy became available.…”
Section: Introductionmentioning
confidence: 99%
“…This effect is enhanced due to the large weight difference between W and C. These problems have been overcome by using in situ ion-beam analysis of the irradiated surface with an analysis beam cross-section of ≈1 mm 2 , so that the corresponding fluence distribution in the analysed area is sufficiently uniform. As an example, the evolution of the mixed surface, derived from Rutherford Back-Scattering (RBS) and Bayesian analysis, is shown in Figure 1 [17]. One can see that the depth of C implantation remains the same at fluence <0.44×10 22 m -2 .…”
Section: Interaction Of C + With W At Room Temperature (Rt)mentioning
confidence: 99%
“…Using these relations, the results of the local measurements can be expressed in the form of implantation-sputtering curves for each species [17]. The evolution of the surface composition under ion bombardment, expressed by such an implantation-sputtering curve, depends only on properties of the surface and projectile atoms, and on the kinematic parameters of the incident ions.…”
Section: Interaction Of C + With W At Room Temperature (Rt)mentioning
confidence: 99%