Reliability analysis for systems with self-healing mechanism in degradation-shock dependence processes with changing degradation rate

Kang, Fengming; Cui, Lirong; Ye, Zhisheng; Zhou, Yu

doi:10.1016/j.ress.2023.109671

Cited by 10 publications

(1 citation statement)

References 39 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Currently, research on degradation and shock correlation focuses on multi-component systems. The interrelationships of degradation and shock, such as competition and accumulation [20][21][22][23], are discussed at the component level. The reliability model of multicomponent systems is constructed by mainly considering the mutual effects of soft and hard failures of different components subject to degradation and shock at the system level [24][25][26][27].…”

Section: Introductionmentioning

confidence: 99%

Cascading Failure Modeling for Circuit Systems Considering Continuous Degradation and Random Shocks Using an Impedance Network

Jin,

Zhang

2024

Symmetry

View full text Add to dashboard Cite

The reliability of circuit systems is primarily affected by cascading failures due to their complex structural and functional coupling. Causes of cascading failure during circuit operation include the continuous degradation process of components and external random shocks. Circuit systems can exhibit asymmetric structural changes and functional loss during cascading failure propagation due to the coupling of degradation and shock and their uncertainty effects. To tackle this issue, this paper abstracts the circuit into an impedance network and constructs a component failure behavior model that considers the correlation between degradation and shock. The interactions between soft and hard failure processes among different components are discussed. Two types of cascading failure propagation processes are described: slow propagation associated with continuous degradation and damage shock, and fast propagation due to fatal shock. Based on this, a cascading failure simulation algorithm is developed. This article presents a case study to demonstrate the proposed models and to analyze the reliability of a typical circuit system.

show abstract