Reliability Analysis of 0.5μm CMOS Operational Amplifiers under TID Effects

Cardoso, Guilherme; Balen, Tiago R.; Lubaszewski, Marcelo; Gonçalez, Odair Lélis

doi:10.29292/jics.v9i1.390

Cited by 6 publications

(2 citation statements)

References 13 publications

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“…7, the module with higher degradation is the SAR converter operating at 74 ksps. The non-monotonic behavior of the THD in respect to the dose is probably related to the rebound (or super recovery) effect [24], which was already observed and explained in details in previous irradiation experiments with programmable analog devices [25,26]. Fig.…”

Section: B Test Results and Considerationsmentioning

confidence: 52%

Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

González

Machado

Vaz³

et al. 2021

JICS

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This work presents results of three distinct radiation tests performed upon a fault-tolerant data acquisition system comprising a design diversity redundancy technique. The first and second experiments are Total Ionizing Dose (TID) essays, comprising gamma and X-ray irradiations. The last experiment considers single event effects, in which two heavy ion irradiation campaigns are carried out. The case study system comprises three analog-to-digital converters and two software-based voters, besides additional software and hardware resources used for controlling, monitoring and memory management. The applied Diversity Triple Modular Redundancy (DTMR) technique, comprises different levels of diversity (temporal and architectural). The circuit was designed in a programmable System-on-Chip (PSoC), fabricated in a 130nm CMOS technology process. Results show that the technique may increase the lifetime of the system under TID if comparing with a non-redundant implementation. Considering the heavy ions experiments the system was proved effective to tolerate 100% of the observed errors originated in the converters, while errors in the processing unit present a higher criticality. Critical errors occurring in one of the voters were also observed. A second heavy-ion campaign was then carried out to investigate the voters reliability, comparing the dynamic cross-section of three different software-based voter schemes implemented in the considered PSoC.

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Section: B Test Results and Considerationsmentioning

confidence: 52%

Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

González

Machado

Vaz³

et al. 2021

JICS

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show abstract

“…TID exposure in CMOS OPAMPs can reduce gain-bandwidth, potentially increasing susceptibility to high-frequency distortion as seen in 0.5 μm CMOS devices with pMOS input differential pairs. Improved radiation hardness is observed in architectures using nMOS-input stages, which show better linearity, resilience to threshold voltage shifts, and less performance degradation overall [149]. These radiation-induced limitations on bandwidth are also observed in bipolar OPAMPs, e.g.…”

Section: Opampsmentioning

confidence: 89%

COTS Devices for Space Missions in LEO

Brunetti,

Campiti,

Tagliente

et al. 2024

IEEE Access

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In the framework of the NewSpace revolution, time-to-market and budget constraints drive the development of small and medium-sized satellites in Low Earth Orbit (LEO) orbit. The adoption of Commercial Off-the-Shelf (COTS) components represents the current trend to fulfill the NewSpace goals, given their low cost, wide product availability, small time-to-market, and the ability to integrate the most recent advancements in space applications. However, migrating from radiation-hardened (rad-hard) devices to COTS ones requires ensuring comparable reliability levels. To this end, an "upscreening" of the COTS devices and systems should be performed in compliance with widely adopted standard regulations, such as those used by ESA or NASA. In this paper, we review COTS components and systems, such as diodes, Bipolar Junction Transistors (BJTs), Field Effect Transistors (FETs), Operational Amplifiers (OPAMPs), memories, and Field Programmable Gate Arrays (FPGAs), proven-flight or ad-hoc tested for compliance with standard regulations. In conclusion, the most promising devices in terms of cost and radiation tolerances are identified, providing useful benchmarks for space engineers developing COTS-based innovative systems.

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Programmable CCCII: reliability analysis and design methodology

Tiwari

Pandey

Paul

et al. 2019

IET Circuits, Devices & Systems

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In this study, an effective and efficient approach for reliability analysis is developed to bridge the gap between devicelevel reliability and that at the product level. Continual reduction of device dimensions, gate-oxide and increase in channel doping results in an increased electric field which is introducing most of the reliability concerns. Four most important reliability issues impacting circuit design are hot carrier injection, bias temperature instability, time-dependent dielectric breakdown and self-heating. As the second-generation current controlled conveyor (CCCII) circuit are used to implement oscillator, filter clock and so on, which are working continuously even in sleep mode. So it is important to take care of all the reliability aspects while designing CCCII. There is a challenge in complex design to identify which devices (MOS, resistor and capacitor) are susceptible to degradation and then redesign and mitigate this effect for a robust and reliable design. The objective of this work is to detect reliability issues and design a programmable current conveyor which can work safely for a long duration. The circuit has been designed and simulated using 28 nm CMOS technology model parameters on Cadence Virtuoso/AMS environment (ELDO simulator) using ± 1.8 V supply voltage and results have been verified with post-layout netlist.

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Reliability Analysis of 0.5μm CMOS Operational Amplifiers under TID Effects

Cited by 6 publications

References 13 publications

Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

COTS Devices for Space Missions in LEO

Programmable CCCII: reliability analysis and design methodology

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