1998
DOI: 10.1117/12.304447
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Reliability aspects of 980-nm pump lasers in EDFA applications

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Cited by 22 publications
(6 citation statements)
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“…The wafers were processed into the ridge-waveguide laser diodes in the same way as our 8xx devices [3] . The E2 facet passivation technology [4] provided maximum protection against catastrophic optical mirror damage (COMD), which is crucial with respect to long-term stability required in high power applications. In order to develop devices that are optimized either for high power conversion efficiency at low currents or high power performance, the laser were processed into ~94 µm wide waveguides with cavity lengths of 2.4 mm or 3.6 mm, respectively.…”
Section: Chip Design and Processingmentioning
confidence: 99%
“…The wafers were processed into the ridge-waveguide laser diodes in the same way as our 8xx devices [3] . The E2 facet passivation technology [4] provided maximum protection against catastrophic optical mirror damage (COMD), which is crucial with respect to long-term stability required in high power applications. In order to develop devices that are optimized either for high power conversion efficiency at low currents or high power performance, the laser were processed into ~94 µm wide waveguides with cavity lengths of 2.4 mm or 3.6 mm, respectively.…”
Section: Chip Design and Processingmentioning
confidence: 99%
“…To avoid catastrophic damage, we run the diode with 400 mA, obtaining 379 mW incident on the Nd:YVO crystal. Due to the E2-facet passivation technology [28], this single-mode laser reveals an excellent reliability at high-power densities. For a mount temperature of 24 C, the optical spectrum is centered at 808.7 nm and has a spectral linewidth below 1 nm.…”
Section: B Experimental Setupmentioning
confidence: 99%
“…Usually, three major failure modes are considered as the driving mechanisms for sudden failures. Whereas catastrophic optical mirror damage (COMD) [11,12] is not observed anymore and packaginginduced failure (PIF) also has been suppressed or eliminated [13,14], most sudden failures are caused by a dislocation growth from the outside of the active region [15]. In the following, we shall assume that pump power drops instantaneously.…”
Section: Failure Scenariosmentioning
confidence: 99%