Reliability Assessment and Remaining Useful Life Prediction Based on the Inverse Gaussian Step-Stress Accelerated Degradation Data

Jiang, Peihua; Wang, Bingxing; Wang, Xiaofei; Tsai, Tzong-Ru

doi:10.1109/tr.2023.3328369

IEEE Trans. Rel.

2024

DOI: 10.1109/tr.2023.3328369

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Reliability Assessment and Remaining Useful Life Prediction Based on the Inverse Gaussian Step-Stress Accelerated Degradation Data

Peihua Jiang,

Bingxing Wang,

Xiaofei Wang

et al.

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Cited by 5 publications

References 40 publications

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Optimal planning of step‐stress accelerated degradation test based on Tweedie exponential dispersion process with random effects

He,

Yan,

Liu

et al. 2024

Quality & Reliability Eng

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The step stress accelerated degradation test (SSADT) is an effective tool for assessing the reliability of highly reliable products. However, conducting an SSADT is expensive and time consuming, and the obtained SSADT data has an impact on the accuracy of the subsequent product reliability index estimations. Consequently, devising a cost‐constrained SSADT plan that yields high‐precision reliability estimates poses a significant challenge. This paper focuses on the optimal design of SSADT for the Tweedie exponential dispersion process with random effect (TEDR), a general degradation model capable of describing product heterogeneity. Under given budget and boundary constraints, the optimal sample size, observation frequency and observation times at each stress level are obtained by minimizing the asymptotic variance of the estimated quantile life at normal operating conditions. The sensitivity and stability of the SSADT plan are also studied, and the results indicate the robustness of the optimal plan against slight parameters fluctuations. We use the expectation maximization (EM) algorithm to estimate TEDR parameters and reliability indicators under SSADT, providing a systematic method for obtaining the optimal SSADT plan under budget constraints. The proposed framework is illustrated using the case of LED chips data, showcasing its potential for practical application.

show abstract

Optimal planning of step‐stress accelerated degradation test based on Tweedie exponential dispersion process with random effects

He,

Yan,

Liu

et al. 2024

Quality & Reliability Eng

View full text Add to dashboard Cite

show abstract

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

Qu,

Li,

Zhao

et al. 2024

Quality & Reliability Eng

View full text Add to dashboard Cite

Step‐stress accelerated degradation test (SSADT) has become a prevailing approach to lifetime assessment for highly reliable products. In practice, many products suffer from multiple degradation processes that significantly contribute to failures. In this paper, we investigate the optimal SSADT plans for products subject to two dependent degradation characteristics modeled by a bivariate inverse Gaussian process. The drift parameter of each process is assumed to be influenced by a common stress factor. A bivariate Birnbaum‐Saunders (BVBS)‐type distribution is employed to approximate the lifetime distribution and facilitate the derivation of the objective function. The optimal plans are prescribed under three common optimality criteria in the presence of constraints on test units and inspections. A revisited example of fatigue crack is then presented to demonstrate the proposed methods. Finally, the sensitivity of the SSADT plans is studied, and the results exhibit fair robustness of the optimal plans.

show abstract

A distribution-free method for reliability improvement based on design of experiments

Lv,

Sun,

Cheng

et al. 2025

Reliability Engineering & System Safety

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Reliability Assessment and Remaining Useful Life Prediction Based on the Inverse Gaussian Step-Stress Accelerated Degradation Data

Cited by 5 publications

References 40 publications

Optimal planning of step‐stress accelerated degradation test based on Tweedie exponential dispersion process with random effects

Optimal planning of step‐stress accelerated degradation test based on Tweedie exponential dispersion process with random effects

Optimal step stress accelerated degradation tests with the bivariate inverse Gaussian process

A distribution-free method for reliability improvement based on design of experiments

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