2017
DOI: 10.1016/j.ress.2017.03.013
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Reliability assessment model considering heterogeneous population in a multiple stresses accelerated test

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Cited by 33 publications
(19 citation statements)
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“…The Arrhenius model is widely used in accelerated test evaluation method using temperature as accelerated stress. Its reaction rate model under temperature stress is given by the literature 1,4,5,11,26,27 k single = a 0 0 exp…”
Section: A Universal Multi-stress Acceleration Modelmentioning
confidence: 99%
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“…The Arrhenius model is widely used in accelerated test evaluation method using temperature as accelerated stress. Its reaction rate model under temperature stress is given by the literature 1,4,5,11,26,27 k single = a 0 0 exp…”
Section: A Universal Multi-stress Acceleration Modelmentioning
confidence: 99%
“…Lifetime prediction technology based on accelerated test has become an inevitable requirement for products' reliability calculation under time and cost constraints. 1,2 However, products usually undergo multi-stress in use conditions, [3][4][5][6][7] including working stress (such as current, voltage, and mechanical load) and environmental stress (such as temperature, humidity, vibration, and shock). Therefore, the traditional accelerated test with single stress cannot simulate the actual stress environment of the product.…”
Section: Introductionmentioning
confidence: 99%
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“…To address the conflicts among methodologies, some novel methods for data fusion have been proposed, like the hybrid multivariate analysis method, 19,20 the multiple step methods, [21][22][23] and the hybrid methods. 24 Although the present methodologies and techniques are feasible to resolve some problems, the emergence of nondestructive tests, SHM, and equipment evaluation using vibration information demands for the further development to achieve the essential data fusion.…”
mentioning
confidence: 99%
“…Thus, accelerated degradation tests (ADT) are widely used to accelerate the failure/degradation processes by exposing the products to severe test conditions. Successful applications of ADT have been developed for batteries [2], light-emitting diodes [3], metal-oxide-semiconductor field-effect transistors [4], smart electricity meter [5], and others.…”
mentioning
confidence: 99%