2018
DOI: 10.1016/j.apm.2018.07.039
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Reliability evaluation based on a dependent two-stage failure process with competing failures

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Cited by 101 publications
(50 citation statements)
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“…According to (7), we integrate Pr (FIE j,k \TE j,i ) and Pr (FIE j,k \TE j,p ) evaluated in Step 3 (particularly, (16), (18), (21), (23), and (25) for Pr (FIE j,k \TE j,i ) and (15), (17), (20), and (22), Table 3, for Pr (FIE j,k \TE j,p ), and Pr (SF|FIE j,k \TE j,i ) evaluated in Step 4 (particularly, (26), (27), (28), and (29), and Then according to (9), Q can be computed by integrating (10), (11), (30), (31), and (32). Finally, according to (1), the unreliability of the example WBAN system is evaluated by integrating (8) and (9).…”
Section: Step 5: Integrate For Final System Unreliabilitymentioning
confidence: 99%
See 1 more Smart Citation
“…According to (7), we integrate Pr (FIE j,k \TE j,i ) and Pr (FIE j,k \TE j,p ) evaluated in Step 3 (particularly, (16), (18), (21), (23), and (25) for Pr (FIE j,k \TE j,i ) and (15), (17), (20), and (22), Table 3, for Pr (FIE j,k \TE j,p ), and Pr (SF|FIE j,k \TE j,i ) evaluated in Step 4 (particularly, (26), (27), (28), and (29), and Then according to (9), Q can be computed by integrating (10), (11), (30), (31), and (32). Finally, according to (1), the unreliability of the example WBAN system is evaluated by integrating (8) and (9).…”
Section: Step 5: Integrate For Final System Unreliabilitymentioning
confidence: 99%
“…In previous studies, competitions of different failure modes were considered for designing maintenance policies. In Qiu and Cui, the reliability performance was evaluated for systems subject to a dependent two‐stage failure process with competing defect‐based and duration‐based failure modes. In Roy and Mukhopadhyay and Srivastava and Gupta, accelerated life tests were conducted under competing failure causes.…”
Section: Introductionmentioning
confidence: 99%
“…More precisely, once an external shock occurs, the hazard rate of the hard failure has a random jump. This is known as shot‐noise process, (see, eg, Lemoine and Wenocur and Cha), which is observed in many systems such as electronic actuators or load sharing systems. Here, we denote by Y i the hazard rate increment caused by the i th, ( i = 1, 2, …) shock.…”
Section: Problem Statementmentioning
confidence: 99%
“…The durations of normal and defective states are, respectively, denoted by random variables X and Y with corresponding baseline hazard rate functions λ X ( t ) and λ Y ( t ). Based on the definition of shot‐noise process, eg, Cha and Mi, Levitin and Finkelstein, and Qiu and Cui, the random hazard rate of X in the presence of external shocks, h X ( t ), is expressed as hX()t=λX()t+i=1N(),0tUi where U i , i = 1, 2, … are the hazard rate increments due to the i th external shock in normal state which are independent and identically distributed, and N ( s , t ) is the number of shocks occurring in time interval ( s , t ).…”
Section: Problem Descriptionmentioning
confidence: 99%
“…The durations of normal and defective states are, respectively, denoted by random variables X and Y with corresponding baseline hazard rate functions λ X (t) and λ Y (t). Based on the definition of shot-noise process, eg, Cha and Mi, Levitin and Finkelstein, and Qiu and Cui, 17,19,38 the random hazard rate of X in the presence of external shocks, h X (t), is expressed as…”
Section: System Failure Behaviormentioning
confidence: 99%