Reliability evaluation of a fault-tolerant three-phase interleaved DC-DC boost converter

Abstract

This paper focuses on the reliability improvement of a three-phase interleaved DC-DC boost converter'. In this paper, a new reconfiguration and switching strategy is proposed. The basic principle of the proposed strategy is bypassing the faulty phase (faulty switch), thus, the other phases can share the responsibility of the faulty phase. Meanwhile, three redundant structures consisting of parallel, standby and series configurations of power switches are considered, which can improve the reliability of the converter. This paper uses Markov chain method to evaluate the reliability of the system. The feasibility of the proposed switching and fault management strategies are verified by simulation and experimental results.

Thermomechanical Fatigue Damage Model of a Solder Joint in Electronic Devices: An Interval Arithmetic Based Approach

“…Several studies deal with reliability assessment of power electronic systems [8]- [13]. Reliability assessment of a multistate interleaved DC-DC converters and cost minimizing have been considered in [12] employing MIL-HDBK-217F.…”

“…Effect of power switches and capacitors parameters on the failure rate has been investigated. There are also various studies concentrating on DC-DC converters reliability assessment based on mathematical methods [11]- [13]. Design for reliability, failure root cause identification, mission profile consideration and mutual and self-degradation effects consideration as well are all being missed in these studies leading to optimistic results.…”

A Limited Common-Mode Current Switched-Capacitor Multilevel Inverter Topology and Its Performance and Lifetime Evaluation in Grid-Connected Photovoltaic Applications

“…The other advantage of the proposed inverter is that it draws a continuous current from the input. Detection of the weakest components in the suggested inverter using the presented reliability analyses is an indispensable part of the reliability-based design to lower the risks of semiconductor devices during operation [15][16][17]. Since the electrical and thermal stresses of the semiconductor devices change through the inverter, a method is required to consider the variable stresses on the semiconductor devices, which is called mission-profile based lifetime estimation [18,19].…”

Robust structured controller synthesis for interleaved boost converters using an H∞ control method

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