Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED

Jeong, Jaeseong; Jung, Jinkyu; Park, Sang-Deuk

doi:10.1016/j.microrel.2008.07.029

Cited by 24 publications

(8 citation statements)

References 3 publications

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“…Therefore, how to screen out the weak LED die is of significant importance. Dal Lago et al [5] measured the dynamic electroluminescence and current waveforms, and Jeong et al [6] did an accelerated life test and suggested a screening policy to screen the leakage LED.…”

Section: Introductionmentioning

confidence: 99%

“…For mass production, we need a rapid method to screen out the leakage LED. The authors in Reference [6] suggested a screening criterion on the sub turn-on voltage, using the related larger leakage current which happened at the minor turn-on region and can be submitted to the auto tester. However, for those LED chips with weak anti-electrostatic ability, it is difficult to find some differences on the current-voltage curves, i.e., the LED dies with apparent I-V curve agree well with the ideal diode curve such that we cannot screen them out.…”

Section: Introductionmentioning

confidence: 99%

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A Screen Method for the Mass-Production of the Small-Size and Side-View LED Package

Chen

Luo

2018

Crystals

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In this study, the small-size and side-view LED packages used in the backlight modules were examined by performing the electrostatic discharge (ESD) process. The high voltages used for the ESD process were 2 kV, 3 kV, and 4 kV. After ESD, the current–voltage curves were scanned from −7 V to 3 V. It was found that the significant leakage currents were in the reverse bias of 4 V~7 V and also in the forward bias of 1 V~2.5 V for ESD-damaged LED chips. However, the phenomenon of a slight increase in current was not found for the non-damaged samples. In our study case, the screening conditions could be set at a bias of −7 V or 2.3 V and the current of 0.1 µA.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

A Screen Method for the Mass-Production of the Small-Size and Side-View LED Package

Chen

Luo

2018

Crystals

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“…The other is accelerated tests measuring performance degradation. Using the accelerated life tests, Jeong et al 7 aimed to improve the reliability of an InGaN white LED backlight module which was used for the front display in a refrigerator case. Villanueva et al 8 described the methodology known as 'overstress life testing' for LEDs.…”

Section: Introductionmentioning

confidence: 99%

An optimized model for lifetime prediction of LED-based light bars using luminance degradation method

Zhang¹,

Bai

Zhang

et al. 2016

Lighting Research & Technology

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An optimized model is established to improve the accuracy and efficiency of lifetime estimation for LED-based light bars. A Weibull function is used to fit test data of remaining luminance under two groups of accelerated stresses, and a method for determining the optimal test time is put forward. The results show that the optimized model for lifetime prediction best reflects the characteristic of luminance degradation. Furthermore, the error of the accelerated lifetime first decreases and then increases, finally decreasing again, which confirms that the method for determining the optimal test time is feasible given the level of accuracy required.

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“…As per the information given in [1,[4][5][6][7][8][9][10], some of the key factors are; junction temperature, thermal resistance between chip & surrounding, damage or degradation of the plastic encapsulation material, semiconductor defects, humidity or moisture incursion, voltage or current fluctuation malfunction of components in the electronic driver, damage to the wire bonding that connect the LED & soldering defects, degradation of the phosphors or secondary illuminator and cyclic effect. Moreover as indicated in [1,[4][5][6][7][8][9][10], junction temperature, humidity or moisture inclusion, voltage & current fluctuation are the most dominant factors that affect the light output of the HBLEDs.…”

Section: Introductionmentioning

confidence: 99%

Arrhenius Accelerated Life Test for Luminary Life of High Bright Light Emitting Diodes

Edirisinghe

Rathnayake

2015

ILCPA

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The High Bright Light Emitting Diodes (HBLEDs) generally having long life but very often its actual life is different from vendor's specification. Vendors do not specify the failure criteria for their products but it may vary from 50% to 70% light output maintenance. Further time to test such a quantity takes too long under normal conditions. Longer time consumption for evaluation of such a quantity may not useful in mass production process of HBLEDs. The present study describes the determination of the useful lifetime of 1-W HBLEDs using Arrhenius Accelerated Life Test Model with the modeling parameter as the junction temperature. Failure criterion was chosen as 70% light output maintenance while two stress levels were selected as 90 ºC and 110 ºC and as recommended by IES LM-80-08 standard. Furthermore, forward voltage of the HBLED was used to determine junction temperature of the diode which is a critical parameter for this study. Moreover, junction temperature of the HBLED recognized as the most critical factor for degrades the lifespan. The Arrhenius Model is based on the junction temperature and activation energy parameters. The activation energy and the scaling factor were found to be 1.31 eV and 6.86×10 -17 hours respectively. HBLED junction temperature under room temperature (23 ºC) was found to be 55.72 ºC. Finally the 70% luminary life time of 1-W HBLEDs under these conditions was found to be 8,344 hours.

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Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED

Cited by 24 publications

References 3 publications

A Screen Method for the Mass-Production of the Small-Size and Side-View LED Package

A Screen Method for the Mass-Production of the Small-Size and Side-View LED Package

An optimized model for lifetime prediction of LED-based light bars using luminance degradation method

Arrhenius Accelerated Life Test for Luminary Life of High Bright Light Emitting Diodes

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