Reliability

Algora, Carlos; Espinet‐González, Pilar; Vázquez, M.; Bosco, Nick; Miller, David C.; Kurtz, Sarah; Rubio, Fernando; McConnell, R.

doi:10.1002/9781118755655.ch09

Cited by 5 publications

(5 citation statements)

References 73 publications

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“…Except for these cracks, no damage of the semiconductor structure has been observed in the cross-section SEM images. Also, we have seen in [1] that electroplated silver lift-off forces the circulation of very high current densities into the semiconductor in very small areas of the cell structure. The confinement of these high current densities into small semiconductor regions would have favored the creation of defects and cracks turning the solar cells into shunts.…”

Section: Appearance Of Cracks On the Semiconductor Structurementioning

confidence: 99%

“…Reliability data collection has only begun since 2005 running into commercial development, with the exception of a few multiple-hundred kilowatt scale plants. Therefore, CPV lacks a long term (namely 25-30 years) historical record of proven longevity and reliability although the existing data show no detectable degradation in well-designed CPV plants [1]. Furthermore, reliability is a key aspect for an effective CPV cost reduction.…”

Section: Introductionmentioning

confidence: 99%

“…These failures have been considered as infant mortality, because they appeared in the early life of the CPV modules, and only in some solar cells [4]. A review of the degradation tests can be found in [1].…”

Section: Introductionmentioning

confidence: 99%

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Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests

Orlando

Gabás

Galiana

et al. 2016

Progress in Photovoltaics

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Accelerated life tests are frequently used to provide reliability information in a moderate period of time (weeks or months), and after that, a failure analysis is compulsory to detect the failure origins. In this paper, a failure analysis has been carried out after a temperature accelerated life test on lattice matched GaInP/Ga(In)As/Ge triple junction commercial solar cells. Solar cells were forward biased in darkness inside three climatic chambers in order to emulate the photo-generated current under nominal working conditions (a concentration level of 820 suns). After the accelerated aging test, a characterization of the resulting cells by means of quantum efficiency, dark and illumination I-V curves, electroluminescence, scanning electron microscope, energy dispersive X-ray, scanning transmission electron microscope and X-ray photoelectron spectroscopy has been carried out.Current is identified as the cause of degradation while temperature just dominates the accelerating factor of the aging test. Current promotes the front metal damage produced by the chemical evolution of the electroplating impurities together with those of the tab soldering process. Semiconductor structure does not seem to be responsible of any failure. Therefore, this kind of lattice matched GaInP/Ga(In)As/Ge triple junction solar cells, that as of 2016, are the workhorse of CPV technology, exhibits as a very robust device if the front metal connection is properly accomplished.

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Section: Appearance Of Cracks On the Semiconductor Structurementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests

Orlando

Gabás

Galiana

et al. 2016

Progress in Photovoltaics

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“…Well‐developed commercial CPV modules are nowadays very reliable, and they have a negligible impact on the unreliability of modern CPV plants. However, the historic evolution of CPV modules is plenty of different types of failures, such as thermal runaway, ground faults and deficient seal , whose appraisal and comprehension of the physical causes behind have allowed their control and, eventually, their suppression.…”

Section: Introductionmentioning

confidence: 99%

Reliability of commercial triple junction concentrator solar cells under real climatic conditions and its influence on electricity cost

Vázquez

Tamayo-Arriola

Orlando

et al. 2017

Progress in Photovoltaics

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This paper proposes a methodology for assessing the concentrator solar cell reliability in a real application for a given location provided the results from accelerated life tests. We have applied this methodology for the evaluation of warranty times of commercial triple junction solar cells operating inside real concentrator modules in Golden (Colorado, USA), Madrid (Spain) and Tucson (Arizona, USA) for the period 2012-2015. Warranty times in Golden and Madrid, namely, 68 and 31 years, respectively, for the analysed period, indicate the robustness of commercial triple junction solar cells. Nevertheless, the warranty time of 15 years for Tucson suggests the need of improvement in the heat extraction of the solar cell within the concentrator module. Therefore, the influence of the location on the reliability of concentrator solar cells is huge, and it has no sense to supply general reliability values for a given concentrator product. The influence of these warranty times for the three locations on the levelised cost of electricity has been analysed. Cost of €clO-12/kWh can be achieved nowadays, while after 1 GW" cumulative installed power, a dramatic reduction to levels of €c2-3/kWh is achievable.

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“…Thus, concentrator solar cells (hereinafter CPV cells) have to fulfill high lifetime expectations. In order to speed up the commercialization of new CPV cells, valid time-and cost-efficient testing methods are required [2,3].…”

Section: Introductionmentioning

confidence: 99%

Performance and failure analysis of concentrator solar cells after intensive stressing with thermal, electrical, and combined load

Eltermann

Ziegler

Wiesenfarth

et al. 2017

AIP Conference Proceedings

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In this work, we investigated the impact of intensive heat loads on concentrator solar cells assemblies. As test samples, we employed lattice-matched and lattice-mismatched triple-junction solar cells made of GaInP/GaInAs/Ge. The thermal loads were induced by different manners. We used drying cabinets, external power supplies, and a combination of both to achieve maximum test temperatures of 180 °C. For the performance analysis, we utilized flash light solar simulators and an electroluminescence (EL) imaging tool. Our experiments revealed a significant difference depending on the applied manner of heating. The highest impact was observed for the pure heat treatment in drying cabinets. This was particularly visible in the spatial EL images, but also in the IV curves. In contrast, running the concentrator solar cells as forward-biased diodes using an external current supply of 2000 mA, which corresponds to 2000 suns, did not lead to any significant changes in EL and IV curves. However, deformation of the front metallization was observed. In conclusion, pure heat treatment can be considered as a cost-efficient alternative to pinpoint weak points in solar cell receivers

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Reliability

Cited by 5 publications

References 73 publications

Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests

Failure analysis on lattice matched GaInP/Ga(In)As/Ge commercial concentrator solar cells after temperature accelerated life tests

Reliability of commercial triple junction concentrator solar cells under real climatic conditions and its influence on electricity cost

Performance and failure analysis of concentrator solar cells after intensive stressing with thermal, electrical, and combined load

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