Reliability measurement of fault-tolerant onboard memory system under fault clustering

Choi, Alta; Park, N.; Meyer, F.J.; Lombardi, Fabrizio; Piuri, Vincenzo

doi:10.1109/imtc.2002.1007121

Cited by 8 publications

(6 citation statements)

References 12 publications

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“…A simplified version of this model was proposed in [3], leading to results in the memory array reconfiguration problem. Both the center-satellite and quadrat-based fault models are still in use for System on Chip (SoC) (e.g., [11,14]) and VLSI (e.g., [7,26]) applications.…”

Section: Related Workmentioning

confidence: 99%

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The diameter and connectivity of networks with random dependent faults

2009

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We study the connectivity and diameter of the fault-free part of n-node networks where nodes fail in a random dependent way. To capture fault dependencies, we introduce the neighborhood fault model, where damaging events, called spots, occur randomly and independently with probability p at nodes of a network, causing faults in the given node and its neighbors; faults at distance at most 2 become dependent. We investigate the impact of the spot probability on the connectivity and diameter of the fault-free part of the network. We show a network which has a low diameter with high probability, if p ≤ 1/c log n. We also show that, for constant spot probabilities, most classes of networks do not have their fault-free part connected with high probability. For smaller spot probabilities, connectivity with high probability is supported even by bounded degree networks: the torus supports connectivity with high probability when p ∈ 1/ω(n 1/2 ), and does not when p ∈ 1/O(n 1/2 ); a network built of tori is designed, with the same faulttolerance properties and additionally having low diameter. We show, however, that for networks of degree bounded above by a constant , the fault-free part can not be connected with high probability if p ∈ 1/O(n 1/ ). This is the first analytic paper which investigates the connectivity and diameter of networks where nodes fail in a random dependent way.

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Section: Related Workmentioning

confidence: 99%

“…Let B be the event that X t ≥ 72(1 − ) ln 2 n, for some small constant > . As all events P Sx , for fixed S and varying x, are independent, we use a Chernoff bound ( [9], inequality (7)) to show that, if event A occurs, event B occurs with probability 1 − 1/n k log n , for some positive constant k.…”

mentioning

confidence: 99%

The diameter and connectivity of networks with random dependent faults

2009

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“…Since event I u occurs if spots are located at distance 2 from u, the occurrence of this event is independent for nodes whose neighborhoods of radius at most 2 are disjoint. Furthermore, since all nodes have degree at most c 1 log n, by Lemma 6, we have |S| ≥ n/(c 1 log n) 5 . Thus,…”

Section: Lemma 5 In a Graph Of Maximum Degreementioning

confidence: 91%

“…Later on, in [2], the authors proposed a simplified center-satellite model of manufacturing defects on VLSI wafers for the study of the memory array reconfiguration problem. In fact, both the center-satellite and quadrat-based approaches are still in use for System on Chip (SoC) (cf., e.g., [8,9]) and VLSI (cf., e.g., [5,19]) applications. Throughout this field of literature, the consensus is that results originating from the center-satellite approach, as opposed to quadrat-based approaches, are more difficult to apply but provide better prediction quality.…”

Section: Related Workmentioning

confidence: 99%

Communication in Networks with Random Dependent Faults

Kranakis

Paquette

Pełc

Mathematical Foundations of Computer Science 2007

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The aim of this paper is to study communication in networks where nodes fail in a random dependent way. In order to capture fault dependencies, we introduce the neighborhood fault model, where damaging events, called spots, occur randomly and independently with probability p at nodes of a network, and cause faults in the given node and all of its neighbors. Faults at distance at most 2 become dependent in this model and are positively correlated. We investigate the impact of spot probability on feasibility and time of communication in the fault-free part of the network. We show a network which supports fast communication with high probability, if p ≤ 1/c log n. We also show that communication is not feasible with high probability in most classes of networks, for constant spot probabilities. For smaller spot probabilities, high probability communication is supported even by bounded degree networks. It is shown that the torus supports communication with high probability when p decreases faster than 1/n 1/2 , and does not when p ∈ 1/O(n 1/2 ). Furthermore, a network built of tori is designed, with the same fault-tolerance properties and additionally supporting fast communication. We show, however, that networks of degree bounded by a constant d do not support communication with high probability, if p ∈ 1/O(n 1/d ). While communication in networks with independent faults was widely studied, this is the first analytic paper which investigates network communication for random dependent faults.

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“…The quadrant-based model is preferred to the center-satellite model in practice since many parameters used in the center-satellite model makes its parameter estimation difficult [1]. [5] has proposed a reliability model of fault-tolerant onboard memory system under fault clustering.…”

Section: Introductionmentioning

confidence: 99%

Spare Line Borrowing Technique for Distributed Memory Cores in SoC

Jang

Choi²,

Park³

et al.

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings

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In this paper, a new architecture of distributed embedded memory cores for soc is proposed and an effective memory repair method by using the proposed Spare Line Borrowing (software-driven reconfiguration) technique is investigated. It is known that faulty cells in memory core show spatial locality, also known as fault clustering. This physical phenomenon tends to occur more oft en as deep submicron technology advances due to defects that span multiple circuit elements and sophisticated circuit design. The combination of new architecture & repair method proposed in this paper ensures fault tolerance enhancement in Soc, especially in case of fault clustering. This fault tolerance enhancement is obtained through optimal redundancy utilization: Spare redundancy in a fault-resistant memory core is used to fix the fault in a fault prone memory core. The effect of Spare Line Borrowing technique on the reliability of distributed memory cores is analyzed through modeling and extensive parametric simulation.

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Reliability measurement of fault-tolerant onboard memory system under fault clustering

Cited by 8 publications

References 12 publications

The diameter and connectivity of networks with random dependent faults

The diameter and connectivity of networks with random dependent faults

Communication in Networks with Random Dependent Faults

Spare Line Borrowing Technique for Distributed Memory Cores in SoC

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