Reliability Model for Electronic Devices under Time Varying Voltage

Méndez‐González, Luis Carlos; Borbón, Manuel Iván Rodríguez; Valles-Rosales, Delia J.; Valle, Arturo Del; Rodríguez, Alexander Cárdenes

doi:10.1002/qre.1867

Cited by 13 publications

(3 citation statements)

References 11 publications

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“…Many works are found to attempt the problems on reliability optimization using GA, PSO, ABC algorithms and other heuristic algorithms. Again, in most of the works, the component reliabilities are of constant values and only few (Mori and Ellingwood, 1993;Me ´ndez et al 2015;Mourelatos et al 2015;Wang et al 2015;Zhu and Zhifu 2016;Ahmadivala et al 2019;Zafar and Wang 2020) are seen to consider these as time dependent functions. However, the component reliabilities should be time dependent.…”

Section: Introductionmentioning

confidence: 99%

Development of a blended particle swarm optimization to optimize mission design life of a series–parallel reliable system with time dependent component reliabilities in imprecise environments

et al. 2021

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Maximization of system reliability is a topic of much concern in the field of engineering design, telecommunication, aircraft design, plant and factory establishing, producing of sensitive devices, and many production management. The main goal of reliability optimization is to construct highly reliable system or to design maximum reliable system so that the system can run smoothly without any hindrance under some restrictions in the form of constraints for a specified period of time maintaining the safety and efficiency. In this paper, we consider Redundancy Allocation Problem (RAP) involving time dependent component reliabilities for optimizing system reliability of the problem designed. Moreover, we have considered a new objective function as the Mission Design Life (MDL) of reliable system. The MDL is found by integrating the system reliability with respect to time from zero to mission time. This consideration makes the problem more realistic by taking the fact into account that reliability of the system varies with time. Here, we have maximized the Mission Design Life of reliable system with the time dependent component reliabilities by implementing the proposed Blended WQPSO (BWQPSO). The BWQPSO is developed by incorporating the Big-M penalty function in the Weighted Quantum behaved Particle Swarm Optimization and it is found to perform highly satisfactorily to solve the highly nonlinear combinatorial problem so designed as a time dependent redundancy allocation problem. Again, to tackle the uncertain behaviour of controlling parameters, we incorporated the fuzziness and intuitionistic fuzziness to develop the imprecise models. The three types of problems designed here are supplemented by numerical examples. The numerical experiments are carried out in each of the environments and comparative studies are presented. The statistical analysis along with computational time and convergence of the proposed algorithm are also produced.

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Section: Introductionmentioning

confidence: 99%

Development of a blended particle swarm optimization to optimize mission design life of a series–parallel reliable system with time dependent component reliabilities in imprecise environments

et al. 2021

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“…These criteria must be able to consider the reliability during the component's lifetime. For this purpose, Mean‐Time‐To‐Failure ( MTTF ) which is defined as the integration of reliability curve from zero to infinity, might serve as an appropriate criterion for such reliability problems …”

Section: Introductionmentioning

confidence: 99%

Reliability Optimization by Considering Time‐Dependent Reliability for Components

Ardakan

Mirzaei

Hamadani

et al. 2017

Quality & Reliability Eng

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Reliability optimization is an important and challenging topic both in engineering and industrial situations as its objective is to design a highly reliable system that operates more safely and efficiently under constraints. Redundancy allocation problem (RAP), as one of the most well‐known problems in reliability optimization, has been the subject of many studies over the past few decades. RAP aims to find the best structure and the optimal redundancy level for each subsystem. The main goal in RAP is to maximize the overall system reliability considering some constraints. In all the previous RAP studies, the reliability of the components is considered constant during the system's mission time. However, reliability is time‐dependent and needs to be considered and monitored during the system's lifetime. In this paper, the reliability of components is considered as a function of time, and the RAP is reformulated by introducing a new criterion called ‘mission design life’ defined as the integration of the system reliability function during the mission time. We propose an efficient algorithm for this problem and demonstrate its performance using two examples. Furthermore, we demonstrate the importance of the new approach using a benchmark problem in RAP. Copyright © 2017 John Wiley & Sons, Ltd.

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“…Thereafter, Silva et al 1 and Cordeiro et al [14][15][16] investigated and defined statistical properties of the BWD. Application of BWD in reliability analysis can be found in Silva et al, 1 Hazra et al, 17 and Méndez et al 18 Other field applications of BWD can be found in Carrasco et al, 6 Sigla et al, 19 Mahmoud and Mandouh, 20 and Sun. 21 In this paper, we propose a reliability analysis by using the BWD and the inverse power law (IPL) to describe the lifetime and performance of ED with a nonmonotone failure rate.…”

Section: Introductionmentioning

confidence: 99%

Reliability analysis for electronic devices using beta‐Weibull distribution

Méndez‐González

Rodríguez‐Picón

Valles-Rosales

et al. 2017

Quality & Reliability Eng

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Today, in reliability analysis, the most used distribution to describe the behavior of electronic products under voltage profiles is the Weibull distribution. Nevertheless, the Weibull distribution does not provide a good fit to lifetime datasets that exhibit bathtub‐shaped or upside‐down bathtub–shaped (unimodal) failure rates, which are often encountered in the reliability analysis of electronic devices. In this paper, a reliability model based on the beta‐Weibull distribution and the inverse power law is proposed. This new model provides a better approach to model the performance and fit of the lifetimes of electronic devices. To estimate the parameters of the proposed model, a Bayesian analysis is used. A case study based on the lifetime of a surface mounted electrolytic capacitor is presented, the results showed that the estimation of the proposed model differs from the inverse power law–Weibull and that it affects directly the mean time to failure, the failure rate, the behavior, and the performance of the capacitor under analysis.

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Reliability Model for Electronic Devices under Time Varying Voltage

Cited by 13 publications

References 11 publications

Development of a blended particle swarm optimization to optimize mission design life of a series–parallel reliable system with time dependent component reliabilities in imprecise environments

Development of a blended particle swarm optimization to optimize mission design life of a series–parallel reliable system with time dependent component reliabilities in imprecise environments

Reliability Optimization by Considering Time‐Dependent Reliability for Components

Reliability analysis for electronic devices using beta‐Weibull distribution

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