Reliability model of the RTC System with trackside equipment equipped with a Peltier cell

Abstract

The article presents a mathematical model assessing the reliability of rail traffic control systems with a mounted Peltier cell. The semiconductor element will be used for operating electronic components that are in the trackside equipment. In the prepared model, Markow processes were used to describe the states occurring between individual components of the RTC System. Simulation tests were mainly based on determining the average time of component failure. The presented results were carried out for 1,000, 2,000 and 3,000 rail vehicle crossings over the railway tracks equipped with RTC Systems. At the very end of the article the conclusions resulting from computer simulations were presented.