2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and 2016
DOI: 10.1109/eurosime.2016.7463309
|View full text |Cite
|
Sign up to set email alerts
|

Reliability of a dual-curable adhesive bond

Abstract: This project aims at evaluating the reliability of a dual-curable adhesive bonded joint used in optical applications. The delamination at the interface adhesivesubstrate is one of the most critical failure modes: once a crack is initiated, it propagates catastrophically even at small loads. The fracture toughness is tested statically and cyclically using state of the art methods. In addition, the use of an electrodynamic shaker to increase the collected data is analyzed: testing on the shaker permits testing s… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 15 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?