2018
DOI: 10.1002/admt.201800364
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Reliable Fabrication of High Aspect Ratio Plasmonic Nanostructures Based on Seedless Pulsed Electrodeposition

Abstract: shape, size, and periodicity. [21,22] For a variety of applications, it is desirable to increase the interaction volume of incident radiation within the nanostructures. [23] Recently, electrochemical deposition of metal through nanometric templates has attracted much interest due to its advantages over physical deposition, [19,[24][25][26][27] such as lower material cost, better film morphology, and higher aspect ratio. [27] Typical plasmonic metals in the UVvis-NIR regions are silver, gold, aluminum, and copp… Show more

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Cited by 11 publications
(12 citation statements)
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“…The differences in the spectral contrast and mode positions are likely due to the dispersive properties of the conductive ITO film, which exhibits free carrier loss in the near infrared. The resistance of the ITO film across for 1 × 1 cm 2 is measured to be 20 Ω, a sufficient resistance to ensure a satisfactory seedless electrodeposition process . Other factors also contribute to the differences, such as the rounding caused by e‐beam proximity effects and thickness nonuniformity of the electrodeposition process (particularly for the tall vSRRs).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The differences in the spectral contrast and mode positions are likely due to the dispersive properties of the conductive ITO film, which exhibits free carrier loss in the near infrared. The resistance of the ITO film across for 1 × 1 cm 2 is measured to be 20 Ω, a sufficient resistance to ensure a satisfactory seedless electrodeposition process . Other factors also contribute to the differences, such as the rounding caused by e‐beam proximity effects and thickness nonuniformity of the electrodeposition process (particularly for the tall vSRRs).…”
Section: Resultsmentioning
confidence: 99%
“…The nanopatterning was carried out by electron‐beam lithography (EBL) on indium tin oxide (ITO)‐coated glass substrate, followed by sonicated cold development process for achieving sub‐15 nm resolution at lower exposure dose . Pulsed electrodeposition was used instead of physical evaporation to overcome the thickness limitation in the lift‐off transfer, in addition to improving the surface morphology of the gold film . The deposition rate for the seedless pulsed gold electrodeposition is presented in the Note S1, Supporting Information.…”
Section: Resultsmentioning
confidence: 99%
“…Figure 1 presents some examples of the high aspect ratio dimer and its variants for investigating the CTP mode, which were fabricated via a combination of nanolithography and pulsed electrodeposition described in our previous work, [50,51] briefly summarized in the following. The nanopatterning was first carried out by electron beam lithography (EBL), followed by a sonicated cold development process.…”
Section: Resultsmentioning
confidence: 99%
“…The differences in the spectral contrast and mode positions are likely due to the dispersive properties of the conductive ITO film, which exhibits free carrier loss in the near infrared. The resistance of the ITO film across for 1x1 cm 2 is measured to be 20 Ω, a sufficient resistance to ensure a satisfactory seedless electrodeposition process [133]. Other factors also contribute to the differences, such as the rounding caused by e-beam proximity effects and thickness non-uniformity of the electrodeposition process (particularly for the tall vSRRs).…”
Section: Resonance Characteristics Of Planar and Tall Vsrrsmentioning
confidence: 98%
“…Pulsed electrodeposition was used instead of physical evaporation to overcome the thickness limitation in the lift-off transfer, in addition to improving the surface morphology of the gold film. [131,133] Based on this technique, vSRRs were successfully fabricated with feature sizes such as width in the sub-30 nm range and height comparable to the resist thickness. An example of the fabricated vSRR in this work is shown in Fig.…”
Section: Characterization Of Electrodeposited Nanostructuresmentioning
confidence: 99%