2023
DOI: 10.1109/jmems.2022.3228188
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Remote Actuation of Silicon Nitride Nanomechanical Resonators Using On-Chip Substrate Capacitors

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Cited by 3 publications
(3 citation statements)
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“…[ 72 ] Remote actuation with on‐chip capacitors is recently shown as potential method to actuate the membrane structure. [ 73 ] Figure 7F demonstrates the measured resonance frequency of MoS 2 as a function of the gate voltage, with an estimated built‐in strain of ≈10 –3 [ 72 ] Joule heating has been utilized to tune the frequency of MoS 2 up to 123%V −1 . [ 74 ] Fringing electrostatic fields have been also used to control the bi‐stability and tune the enhance the frequency sensitivity.…”
Section: Fundamentals Of Micro‐machined Resonant Sensorsmentioning
confidence: 99%
“…[ 72 ] Remote actuation with on‐chip capacitors is recently shown as potential method to actuate the membrane structure. [ 73 ] Figure 7F demonstrates the measured resonance frequency of MoS 2 as a function of the gate voltage, with an estimated built‐in strain of ≈10 –3 [ 72 ] Joule heating has been utilized to tune the frequency of MoS 2 up to 123%V −1 . [ 74 ] Fringing electrostatic fields have been also used to control the bi‐stability and tune the enhance the frequency sensitivity.…”
Section: Fundamentals Of Micro‐machined Resonant Sensorsmentioning
confidence: 99%
“…To measure the near-field radiation signal, we rely on a low-stress SiN membrane (built-in stress ∼60 MPa, inferred from the mechanical resonance eigenfrequencies) with nominal dimensions of 1.7 mm in side length and t SiN = 100 nm thickness. The SiN membrane used in this platform was fabricated in-house, but comparable devices are available commercially. , The temperature of the membrane is inferred in real time through an optical interferometer , that measures shifts of the membrane mechanical resonance frequency due to thermally induced stress relaxation (i.e., material expansion). , The membrane resonance frequency is tracked by phase locking (PLL) the internal oscillator of a lock-in amplifier (Zurich Instrument MFLI) to the membrane eigenfrequency . The lock-in oscillator signal (set to an amplitude of 80 mV) is sent to a piece of piezoelectric ceramic (Thorlabs shear piezoelectric chip, PN:PL5FBP3) that actuates the membrane at its resonance frequency by acoustic coupling through the membrane-chip mount.…”
mentioning
confidence: 99%
“…To measure the near-field radiation signal, we rely on a lowstress SiN membrane (built-in stress ∼60 MPa, inferred from the mechanical resonance eigenfrequencies) with nominal dimensions of 1.7 mm in side length and t SiN = 100 nm thickness. The SiN membrane used in this platform was fabricated in-house, 64 but comparable devices are available commercially. 55,56 The temperature of the membrane is inferred in real time through an optical interferometer 54,65 that measures shifts of the membrane mechanical resonance frequency due to thermally induced stress relaxation (i.e., material expansion).…”
mentioning
confidence: 99%