“…The microwave emissivity ( e ) of the surface can be simplified to (Pabari, ) where r is the Fresnel power reflection coefficient for normal incidence. Since the regolith can be considered to consist of discrete layers (Montopoli et al, ) of smaller size, T B can be simulated for MRM's nadir observing conditions as where κ α ( ν , z ) is the depth‐dependent power absorption coefficient, , ν is the frequency, is the loss tangent of the material, and ε ′ ( z ) and ε ′′ ( z ) are the real and imaginary parts of the effective dielectric constant, respectively.…”