Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

In, Jung-Hwan; Kim, Chan-Kyu; Lee, Seok-Hee; Jeong, Sungho

doi:10.1039/c3ja30298a

Cited by 20 publications

(14 citation statements)

References 17 publications

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“…The LIBS system used in this study was the same as that described in our previous studies [1,5,6], equipped with an Nd:YAG laser (532 nm, 5 ns, top-hat profile) and six channel CCD spectrometer. The CCD gate delay and gate width in experiments were 0.2 μs and 1 ms, respectively.…”

Section: Experimental Conditionsmentioning

confidence: 99%

“…Previously, we reported the optimal spectral lines of Cu, In, Ga for LIBS elemental analysis of CIGS thin films [5,6] and demonstrated that LIBS analysis was highly reproducible [1]. In this work, the LIBS calibration model for quantitative analysis of all four constituent elements including Se is introduced.…”

Section: Introductionmentioning

confidence: 96%

“…To achieve high efficiency, the composition of Cu, In, Ga and Se constituting the CIGS layer is required to be precisely controlled [1]. Thus, the need for rapid quantitative analysis of CIGS thin film is increasing in the development and production sites of CIGS thin film solar cells.…”

Section: Introductionmentioning

confidence: 99%

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Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

Kim

Lee

et al. 2015

Thin Solid Films

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Section: Experimental Conditionsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 96%

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Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

Kim

Lee

et al. 2015

Thin Solid Films

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“…Since this laser irradiation is accompanied by ablation of the specimen material, a depth profile can be recorded (St-Onge and Sabsabi, 2000;Kim et al, 2013 ). The laser-induced breakdown spectroscopy (LIBS) system as well as the experimental procedure used in the present study were described in previous reports (In et al, 2013a;In et al, 2013b;Kim et al, 2013).…”

Section: Laser-induced Breakdown Spectroscopymentioning

confidence: 99%

“…The integral composition of each reference sample was determined by first dissolving the CIGS film in nitric acid solution and subsequently measuring elemental concentration by inductively coupled plasma optical emission spectrometry (ICP-OES, 720-ES, Varian, Inc.) for In, Ga, and Se, and by atomic absorption spectroscopy (AAS, iCE 3000, Thermo Fisher Scientific, Inc.) for Cu. The quantification procedure of the LIBS intensity distributions was described by In et al (2013a). Fig.…”

Section: Laser-induced Breakdown Spectroscopymentioning

confidence: 99%

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques

et al. 2015

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Esta es la versión de autor del artículo publicado en: This is an author produced version of a paper published in:Microscopy and Microanalysis 21.6 (2015): 1644-1648 DOI: http://dx.doi.org/10.1017/S1431927615015093 Copyright: © Microscopy Society of America 2015El acceso a la versión del editor puede requerir la suscripción del recurso Access to the published version may require subscription for the analysis of elemental distributions in thin films were compared, using the example of a 2 µm thick Cu(In,Ga)Se 2 thin film, applied as absorber material in a solar cell. The authors of this work found that similar relative Ga distributions perpendicular to the substrate across the Cu(In,Ga)Se 2 thin film were determined by 18 different techniques. Their spatial and depth resolutions, their measuring speeds, their availabilities, as well as their detection limits were discussed. The present work adds two further techniques to this comparison: laser-induced breakdown spectroscopy and grazingincidence X-ray fluorescence analysis.

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LIBS Analysis of Optical Surfaces and Thin Films

Gerhard¹,

Hermann

2023

Laser Induced Breakdown Spectroscopy (LIBS)

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Elemental analyses of thin films and optical surfaces with complex compositions are challenging as the standard analytical techniques based on measurement calibration are difficult to apply. In this chapter, we show that calibration-free laser-induced breakdown spectroscopy presents a powerful solution, enabling rapid quantitative analyses of multi-elemental thin films or tiny surface volumes of optical materials with high analytical performances. Examples are given for classically polished optical glass and a nickel-chromium-molybdenum alloy film of 150 nm thickness. Thus, broadband spectra, recorded under experimental conditions that enable simple and accurate modeling of plasma emission, are processed via a calibration-free approach based on the calculation of the spectral radiance of a plasma in local thermodynamic equilibrium to deduce the elemental composition. The validation via energy-dispersive X-ray spectroscopy, inductively coupled plasma atomic emission spectroscopy, and Rutherford backscattering spectrometry illustrates that calibration-free LIBS is not only a promising tool, but already a reliable analytical technique.

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Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

Cited by 20 publications

References 17 publications

Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

Rapid quantitative analysis of elemental composition and depth profile of Cu(In,Ga)Se2 thin solar cell film using laser-induced breakdown spectroscopy

Comprehensive Comparison of Various Techniques for the Analysis of Elemental Distributions in Thin Films: Additional Techniques

LIBS Analysis of Optical Surfaces and Thin Films

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