2022
DOI: 10.1021/acsanm.2c04600
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ReS2 Nanosheet-Based Channels for Two-Dimensional Field Effect Transistors and Phototransistors with High Photoresponsivity

Abstract: Compared to traditional bulk materials, two-dimensional transition metal dichalcogenides (2D TMDCs) hold the potential in low power logic, photoelectric, and nonvolatile memory devices due to a tunable band structure, pure heterojunction interface, and photodetection for a wide spectral range. ReS 2 is chosen as the channel material in our work because it possesses excellent photoresponsivity. In addition, a BN dielectric is inserted between SiO 2 and ReS 2 as a gate dielectric. The pure heterojunction interfa… Show more

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Cited by 7 publications
(7 citation statements)
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“…The few-layer WSe 2 transistor exhibits an obvious ambipolar characteristic with an off-state around the gate-source bias ( V GS ) of −5 V. The transfer curves of the ReS 2 transistor in Figure b indicate an obvious n-type characteristic and a high current on/off ratio (>10 7 ). In addition, the calculated maximal mobilities were 11.700 and 23.283 cm 2 V –1 s –1 for the ReS 2 and WSe 2 transistors, respectively, according to μ = (Δ I DS /Δ V GS )­( L / WC ox V DS ) at V DS of 1 V, where L , W , and C ox are the channel length, channel width, and gate dielectric capacitance, respectively, in agreement with previous reports. Parts a and b of Figure S2 show the output characteristics of few-layer WSe 2 and ReS 2 transistors at different gate voltages. Also, the output currents of both the WSe 2 and ReS 2 transistors linearly increase with the drain voltage, which illustrates that the source and drain electrodes are excellent ohmic contacts for these two devices.…”
Section: Results and Discussionsupporting
confidence: 87%
“…The few-layer WSe 2 transistor exhibits an obvious ambipolar characteristic with an off-state around the gate-source bias ( V GS ) of −5 V. The transfer curves of the ReS 2 transistor in Figure b indicate an obvious n-type characteristic and a high current on/off ratio (>10 7 ). In addition, the calculated maximal mobilities were 11.700 and 23.283 cm 2 V –1 s –1 for the ReS 2 and WSe 2 transistors, respectively, according to μ = (Δ I DS /Δ V GS )­( L / WC ox V DS ) at V DS of 1 V, where L , W , and C ox are the channel length, channel width, and gate dielectric capacitance, respectively, in agreement with previous reports. Parts a and b of Figure S2 show the output characteristics of few-layer WSe 2 and ReS 2 transistors at different gate voltages. Also, the output currents of both the WSe 2 and ReS 2 transistors linearly increase with the drain voltage, which illustrates that the source and drain electrodes are excellent ohmic contacts for these two devices.…”
Section: Results and Discussionsupporting
confidence: 87%
“…Such a high SS might indicate a high density of defects at the interface with SiO 2 , which are also the main cause of the hysteresis. The quality of the interface with the gate dielectric can be improved through the introduction of an ultrathin BN dielectric, which results in higher electrical performances of the device . The field-effect mobility of ∼3 cm 2 V –1 s –1 was extracted from the linear part of the transfer curve on the linear scale, shown in the inset of Figure b, according to the formula where C ox = 1.15 × 10 –8 F cm –2 is the gate dielectric capacitance.…”
Section: Resultsmentioning
confidence: 99%
“…The quality of the interface with the gate dielectric can be improved through the introduction of an ultrathin BN dielectric, which results in higher electrical performances of the device. 32 The field-effect mobility of ∼3 cm 2 V −1 s −1 was extracted from the linear part of the transfer curve on the linear scale, shown in the inset of Figure 2b, according to the formula where C ox = 1.15 × 10 −8 F cm −2 is the gate dielectric capacitance. The result is consistent with other works on similar devices 18,19 and is typical of several TMDs.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Here, h-BN as a dielectric provides the 2D material channel with negligible drain current hysteresis and higher mobility. [307,315] This suggests that by choosing a low resistance metallization and encapsulating the ReSe 2 with h-BN layers on either side, FETs with improved performance can be achieved. Calculated field-effect mobility (166 cm 2 / Vs at 200 K) and current ON/OFF ratio (≈10 7 ) values obtained from such a device, are among the highest values reported.…”
Section: Recent Advances In Rese 2 Based Photodetectorsmentioning
confidence: 99%